المؤلفون: Shamanna, M., Fischer, K., Hafez, W., Jiang, L., Kobrinsky, M., Lin, Chung-Hsun, Mistry, K., Natarajan, S., Ramaswamy, R., Sell, B.

المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Hafez, W., Agnihotri, P., Asoro, M., Aykol, M., Bains, B., Bambery, R., Bapna, M., Barik, A., Chatterjee, A., Chiu, P.C., Chu, T., Firby, C., Fischer, K., Fradkin, M., Greve, H., Gupta, A., Haralson, E., Haran, M., Hicks, J., Illa, A., Jang, M., Klopcic, S., Kobrinsky, M., Kuns, B., Lai, H.-h., Lanni, G., Lee, S.-H., Lindert, N., Lo, C.-l., Luo, Y., Malyavanatham, G., Marinkovic, B., Maymon, Y., Nabors, M., Neirynck, J., Packan, P., Paliwal, A., Pantisano, L., Paulson, L., Penmatsa, P., Prasad, C., Puls, C., Rahman, T., Ramaswamy, R., Samant, S., Sell, B., Sethi, K., Shah, F., Shamanna, M., Shang, K., Li, Q., Sibakoti, M., Stoeger, J., Strutt, N., Thirugnanasambandam, R., Tsai, C., Wang, X., Wang, A., Wu, S.-j., Xu, Q., Zhong, X.-h., Natarajan, S.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Shamanna, M., Abuayob, E., Aenuganti, G., Alvares, C., Antony, J., Bahudhanam, A., Chandran, A., Chew, P., Chatterjee, A., Chauhan, B., Dandeti, N., Desai, J., Doyle, M., Dmukauskas, T., Farache, P., Fetzer, E., Fischer, K., Hack, P., Greenzweig, Y., Giacobbe, J., Hafez, W., Haralson, E., Hegde, A., Illa, A., Islam, M., Jain, S., Jang, M., Nguyen, J., Tong, T., Jiang, L., Karl, E., Kalangi, P., Khoo, G., Krishnamoorthy, A., Kuns, B., Li, W., Livengood, R., Malik, T., Priyanka, R., Faraby, H., Maymon, Y., Mistry, K., Morgan, K., Natarajan, S., Nevo, O., Oh, M., Pardy, P., Park, J., Penmatsa, P., Phelps, B., Peterson, C., Rajappa, S., Raveh, A., Rezaie, A, Ravishankar, T., Ramaswamy, R., Reddy, S., Saha, R., Sen, S., Sanchez, R., Sanaga, R., Simkhovich, B., Sell, B., Senger, M., Schnarch, B., Seshadri, M., Sidorov, O., Subramaniam, S., Subramanian, K., Truong, B., Bangalore, S., Hicks, J., Venkatesh, S., Christensen, D., Bhargav, K., Haartman, M. Von, Joshi, P., Zickel, S., Lin, C-H, Huening, J., Wu, T-H, Bakken, N., Afzal, A., Raman, A., Rao, Sj., Kawar, V., Neirynck, J., Bradley, D., Duwe, M., Wu, S., Patil, V., Bayoumy, M.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Sell, B., An, S., Armstrong, J., Bahr, D., Bains, B., Bambery, R., Bang, K., Basu, D., Bendapudi, S., Bergstrom, D., Bhandavat, R., Bhowmick, S., Buehler, M., Caselli, D., Cekli, S., Chaganti, Vrsk., Chang, Y. J., Chikkadi, K., Chu, T., Crimmins, T., Darby, G., Ege, C., Elfick, P., Elko-Hansen, T., Fang, S., Gaddam, C., Ghoneim, M., Gomez, H., Govindaraju, S., Guo, Z., Hafez, W., Haran, M., Hattendorf, M., Hu, S., Jain, A., Jaloviar, S., Jang, M., Kameswaran, J., Kapinus, V., Kennedy, A., Klopcic, S., Krishnan, D., Leib, J., Lin, Y.-T., Lindert, N., Liu, G., Loh, O., Luo, Y., Mani, S., Mleczko, M., Mocherla, S., Packan, P., Paik, M., Paliwal, A., Pandey, R., Patankar, K., Pipes, L., Plekhanov, P., Prasad, C., Prince, M., Ramalingam, G., Ramaswamy, R., Riley, J., Perez, J. R. Sanchez, Sandford, J., Sathe, A., Shah, F., Shim, H., Subramanian, S., Tandon, S., Tanniru, M., Thakurta, D., Troeger, T., Wang, X., Ward, C., Welsh, A., Wickramaratne, S., Wnuk, J., Xu, S. Q., Yashar, P., Yaung, J., Yoon, K., Young, N.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :282-283 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Kulkarni, S.H., Ikram, U., Bhatt, K., Chao, Y., Chang, Y., Jenkins, I., Murari, V., Thambithurai, D., Hasan, M., Li, J., Paulson, L.R., Sell, B., Bhattacharya, U., Zhang, Y.

المصدر: IEEE Solid-State Circuits Letters IEEE Solid-State Circuits Lett. Solid-State Circuits Letters, IEEE. 4:2-5 2021

المؤلفون: Alzate, J.G., Arslan, U., Bai, P., Brockman, J., Chen, Y. J., Das, N., Fischer, K., Ghani, T., Heil, P., Hentges, P., Jahan, R., Littlejohn, A., Mainuddin, M., Ouellette, D., Pellegren, J., Pramanik, T., Puls, C., Quintero, P., Rahman, T., Sekhar, M., Sell, B., Seth, M., Smith, A. J., Smith, A. K., Wei, L., Wiegand, C., Golonzka, O., Hamzaoglu, F.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.4.1-2.4.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Lee, H.-J., Morarka, S., Rami, S., Yu, Q., Weiss, M., Liu, G., Armstrong, M., Su, C. - Y., Ali, D., Sell, B., Zhang, Y.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :25.4.1-25.4.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Lee, H.-J., Rami, S., Ravikumar, S., Neeli, V., Phoa, K., Sell, B., Zhang, Y.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :14.1.1-14.1.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Su, C.-Y., Armstrong, M., Jiang, L., Kumar, S. A., Landon, C. D., Liu, S., Meric, I., Park, K. W., Paulson, L., Phoa, K., Sell, B., Standfest, J., Sutaria, K. B., Wan, J., Young, D., Ramey, S.

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :6F.8-1-6F.8-7 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Woźniak, B., Witek, S., Matraszek-Żuchowska, I., Sell, B., Posyniak, A.

المصدر: In Research in Veterinary Science May 2021 136:192-197