المؤلفون: Sundeep, Dola, KV, Eswaramoorthy, Tanmayi, Bandlamudi, Supriya, M Sai, Madagani, Giridhar

المصدر: 2023 Global Conference on Information Technologies and Communications (GCITC) Information Technologies and Communications (GCITC), 2023 Global Conference on. :1-6 Dec, 2023

Relation: 2023 Global Conference on Information Technologies and Communications (GCITC)

المؤلفون: Tuinhout, Hans, Dieball, Oliver

المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-6 Mar, 2023

Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Okeil, H., Schrag, G., Wachutka, G.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-8 2023

المؤلفون: Rodrigues, Rostan, Zhang, Yuzhi, Jiang, Taosha, Cairoli, Pietro

المصدر: 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Wide Bandgap Power Devices and Applications (WiPDA), 2019 IEEE 7th Workshop on. :187-194 Oct, 2019

Relation: 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)

المؤلفون: Rodrigues, Rostan, Zhang, Yuzhi, Jiang, Taosha, Aeloiza, Eddy, Cairoli, Pietro

المصدر: 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Wide Bandgap Power Devices and Applications (WiPDA), 2018 IEEE 6th Workshop on. :331-337 Oct, 2018

Relation: 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)

المؤلفون: Maiti, Ananda, Maiti, Chinmay K

المصدر: 2013 10th International Conference on Remote Engineering and Virtual Instrumentation (REV) Remote Engineering and Virtual Instrumentation (REV), 2013 10th International Conference on. :1-4 Feb, 2013

Relation: 2013 10th International Conference on Remote Engineering and Virtual Instrumentation (REV)

المؤلفون: Ghannouchi, F. M., Hashmi, M. S.

المصدر: 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2011 IEEE. :133-137 Oct, 2011

Relation: 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

المؤلفون: Chivukula, Venkata S., Veksler, Dmitry, Shur, Michael S.

المصدر: 2008 38th Annual Frontiers in Education Conference Frontiers in Education Conference, 2008. FIE 2008. 38th Annual. :T4E-9-T4E-11 Oct, 2008

Relation: 2008 IEEE Frontiers in Education Conference (FIE)

المؤلفون: Berning, D., Hefner, A., Ortiz-Rodriguez, J.m., Hood, C., Rivera, A.

المصدر: Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE. 1:338-345 Oct, 2006

Relation: 2006 IEEE Industry Applications Conference

المؤلفون: Yi Tai Chen, Bo Hong Lin, Ssu Han Lu, Zi Wei Li, Yu Sheng Tsai, Tai Ping Sun, YewChung Sermon Wu, Hsiang Chen

المصدر: Results in Physics, Vol 19, Iss , Pp 103432- (2020)

مصطلحات موضوعية: Light emitting diode, Reliability, Etching, Quantum wells, Semiconductor device characterization, Physics, QC1-999

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2211379720318982; https://doaj.org/toc/2211-3797

URL الوصول: https://doaj.org/article/9766ce844a884a998948cfc3f921c878