يعرض 1 - 2 نتائج من 2 نتيجة بحث عن '"Seng, Tam Yong"', وقت الاستعلام: 0.70s تنقيح النتائج
  1. 1
    مؤتمر
    Failure Analysis Methodology on Systematic MIM failure in Wafer Fabrication

    المؤلفون: Teo, Angela, Boon, Ang Ghim, Peng, Ng Hui, Qing, Chen Chang, Yun, Xu Nai, Dayanand, N., Seng, Tam Yong, Hong, Mai Zhi, Lam, Jeffrey

    المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018

    Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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  2. 2
    مؤتمر
    Uncovered the “hidden real defect” masked by “other anomaly seen” through deep dive FA in wafer fabrication

    المؤلفون: Teo, Angela, Peng, Ng Hui, Boon, Ang Ghim, Qing, Chen Chang, Yun, Xu Nai, Dayanand, N, Seng, Tam Yong, Hong, Mai Zhi, Lam, Jeffrey

    المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-5 Jul, 2017

    Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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