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1
المؤلفون: Anthony C. Klotz, Brian W. Swider, Seo Hyun Kwon
المصدر: Journal of Applied Psychology. 108:699-727
مصطلحات موضوعية: Applied Psychology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e3af89bcf718d9bb26b3f10e1825c769
https://doi.org/10.1037/apl0001050 -
2
المؤلفون: Seo Hyun Kwon, Myeong Soo Yeo, Hwa-Sung Rhee, Sangwoo Pae, Moon Soo Lee, Min Suk Jeong, Min Kim, Inhak Baick
المصدر: IEEE Transactions on Device and Materials Reliability. 20:286-292
مصطلحات موضوعية: 010302 applied physics, Flow visualization, business.industry, Capillary action, Mechanical engineering, Computational fluid dynamics, 01 natural sciences, Compressible flow, Electronic, Optical and Magnetic Materials, Soldering, 0103 physical sciences, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Porous medium, business, Flip chip, Parametric statistics
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3
المؤلفون: Min Kim, Moon Soo Lee, Myeong Soo Yeo, Inhak Baick, Hwa-Sung Rhee, Seo Hyun Kwon, Eun-Cheol Lee
المصدر: IRPS
مصطلحات موضوعية: Stress (mechanics), Reliability (semiconductor), Computer science, Ball grid array, Semiconductor device modeling, von Mises yield criterion, Chip, Finite element method, Reliability engineering, Metamodeling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::254622a91b24ece6ea464cc79b64acbd
https://doi.org/10.1109/irps46558.2021.9405133