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1دورية أكاديمية
المؤلفون: Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim
المصدر: IEEE Access, Vol 12, Pp 23881-23886 (2024)
مصطلحات موضوعية: BSIM-CMG, deep learning, genetic algorithm, I-V modeling, compact modeling, BCAT, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Hyunseo You, Kihoon Nam, Jehyun An, Chanyang Park, Donghyun Kim, Seonhaeng Lee, Namhyun Lee, Rock-Hyun Baek
المصدر: IEEE Access, Vol 12, Pp 10988-10994 (2024)
مصطلحات موضوعية: Buried-channel-array transistor (BCAT), cryogenic, drain-induced barrier lowering (DIBL), forward body bias, hot-carrier degradation, threshold voltage, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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3
المؤلفون: Hyunseo You, Jehyun An, Kihoon Nam, Bohyeon Kang, Jongseo Park, Namhyun Lee, Seonhaeng Lee, Rock-Hyun Baek
المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f3000f7ca23a61b42b6c85f23f40adb
https://doi.org/10.1109/edtm55494.2023.10102979 -
4
المؤلفون: Jaejun Lee, Seonhaeng Lee, Jinwook Lee, Du-Byung Kim
المصدر: International Journal of Highway Engineering. 20:1-9
مصطلحات موضوعية: Materials science, business.industry, Crack resistance, Structural engineering, business, Joint (geology)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9a24e2913b4a7a0beb5e5f9dab501163
https://doi.org/10.7855/ijhe.2018.20.3.001 -
5
المؤلفون: Seunghun Son, Keon Yoo, Seonhaeng Lee, Yuri Choi, Ki-Bong Nam, Youngmi Ryu, Seon-Yong Cha
المصدر: Solid-State Electronics. 167:107783
مصطلحات موضوعية: Negative-bias temperature instability, Materials science, Dielectric strength, business.industry, Oxide, Time-dependent gate oxide breakdown, Drain-induced barrier lowering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Gate oxide, MOSFET, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, AND gate
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6
المؤلفون: Donghee Son, Hyeokjin Kim, Seonhaeng Lee, Cheolgyu Kim, Ji-Hoon Seo, Bongkoo Kang, Gang-Jun Kim
المصدر: Microelectronics Reliability. 53:1351-1354
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, business.industry, Transistor, Analytical chemistry, Dielectric, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Stress (mechanics), law, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Metal gate, High-κ dielectric, Voltage
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7
المؤلفون: Jeongsoo Park, Chiho Lee, Cheolgyu Kim, Dongwoo Kim, Nam-Hyun Lee, Seonhaeng Lee, Gang-Jun Kim, Bongkoo Kang
المصدر: Microelectronics Reliability. 52:1905-1908
مصطلحات موضوعية: Materials science, Scattering, business.industry, Transistor, Oxide, Electron, Substrate (electronics), Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), chemistry.chemical_compound, chemistry, law, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Nanoscopic scale, Electron scattering
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8
المؤلفون: Dongwoo Kim, Bongkoo Kang, Seonhaeng Lee, Chiho Lee, Jeongsoo Park, Cheolgyu Kim
المصدر: Microelectronics Reliability. 52:1949-1952
مصطلحات موضوعية: Materials science, Subthreshold conduction, business.industry, Transistor, Channel width, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), Impact ionization, law, Shallow trench isolation, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Nanoscopic scale, Communication channel
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9
المؤلفون: Jeongsoo Park, Chiho Lee, Dongwoo Kim, Cheolgyu Kim, Seonhaeng Lee, Bongkoo Kang
المصدر: Microelectronics Reliability. 52:1901-1904
مصطلحات موضوعية: Cyclic stress, Materials science, business.industry, Oxide, Electrical engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Gate oxide, Enhanced degradation, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Metal gate, Leakage (electronics), High-κ dielectric
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10
المؤلفون: S. J. Hong, Cheolgyu Kim, Seonhaeng Lee, Dongwoo Kim, Seon-Yong Cha, Bongkoo Kang, Tae-Kyung Oh
المصدر: Microelectronic Engineering. 91:44-49
مصطلحات موضوعية: Imagination, Dynamic random-access memory, Materials science, Subthreshold conduction, media_common.quotation_subject, Transistor, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Compressive strength, law, Shallow trench isolation, Electrical and Electronic Engineering, Composite material, Dram, Random access, media_common