المؤلفون: Zhang, M., Guo, Y.

المصدر: IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 15(2):1-11 Apr, 2023

المؤلفون: Yue, Xian^{Aff1, Aff2, Aff3}, Yang, Yaliang^{Aff1, Aff2, Aff3, IDs10792024031769_cor2}, Chen, Shen^{Aff1, Aff2, Aff3}, Dai, Hao^{Aff1, Aff2, Aff3}

المصدر: International Ophthalmology: The International Journal of Clinical Ophthalmology and Visual Sciences. 44(1)

المؤلفون: Kim, Ji Hun, Woo, Seong Cheol, Kim, Joohan^{Aff1, IDs12541023009340_cor3}

المصدر: International Journal of Precision Engineering and Manufacturing. 25(3):527-538

المؤلفون: Escobar, David, Vera, Esteban

المصدر: 2021 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON) Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON), 2021 IEEE CHILEAN Conference on. :1-5 Dec, 2021

Relation: 2021 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON)

المؤلفون: Ares Rodríguez, Miguel

المساهمون: University/Department: Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria

مرشدي الرسالة: Royo Royo, Santiago

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: Óptica, Metrología, Instrumentos ópticos, Óptica geométrica, Óptica activa, Shack-Hartmann, Lentes de adición progresiva

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/77915

المؤلفون: Zhao, M., Zhao, W., Wang, S., Yang, P., Yang, K., Lin, H., Kong, L.

المصدر: IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 14(1):1-10 Feb, 2022

المؤلفون: Yi He, Mingdi Bao, Yiwei Chen, Hong Ye, Jinyu Fan, Guohua Shi

المصدر: Light: Advanced Manufacturing, Vol 4, Iss 4, Pp 393-403 (2024)

مصطلحات موضوعية: shack–hartmann wavefront sensor, spherical wavefront calibration, residual aberration correction, high-accuracy measurement of wavefronts, Manufactures, TS1-2301, Applied optics. Photonics, TA1501-1820

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2689-9620

URL الوصول: https://doaj.org/article/c1c0d8f5ee04488abff676ba40f4028f

المؤلفون: Onaka, Jessica, Iwase, Takahiro, Koyama, Daisuke, Matsukawa, Mami

المصدر: 2021 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2021 IEEE International. :1-3 Sep, 2021

Relation: 2021 IEEE International Ultrasonics Symposium (IUS)

المؤلفون: Fuerst, Martin E., Berlakovich, Nikolaus, Csencsics, Ernst, Schitter, Georg

المصدر: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Measurement Technology Conference (I2MTC), 2020 IEEE International Instrumentation and. :1-6 May, 2020

Relation: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Atas, Marie Cattleah D., Landicho, Larish Mariam T., Lobo, Abigail D., Orubia, Carla Joy L., Silverio, Adolph Christian O., Aquino, Aaron U., Amado, Timothy M., Puno, John Carlo V., Quijano, Jay Fel C., Arago, Nilo M.

المصدر: 2019 IEEE 11th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management ( HNICEM ) Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management ( HNICEM ), 2019 IEEE 11th International Conference on. :1-5 Nov, 2019

Relation: 2019 IEEE 11th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management ( HNICEM )