-
1دورية أكاديمية
المؤلفون: Naz, S.F., Mondal, D., Shah, A.P.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(1):59-67 Mar, 2024
-
2دورية أكاديمية
المؤلفون: Naz, S.F., Shah, A.P.
المصدر: IEEE Open Journal of Circuits and Systems IEEE Open J. Circuits Syst. Circuits and Systems, IEEE Open Journal of. 4:241-257 2023
-
3دورية أكاديمية
المؤلفون: Gupta, N., Shah, A.P., Kumar, R.S., Gupta, T., Khan, S., Vishvakarma, S.K.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(4):694-705 Dec, 2020
-
4دورية أكاديمية
المؤلفون: Gupta, N., Shah, A.P., Vishvakarma, S.K.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(1):153-155 Mar, 2021
-
5دورية أكاديميةA Primer on Pulsed Power and Linear Transformer Drivers for High Energy Density Physics Applications
المؤلفون: McBride, R.D., Stygar, W.A., Cuneo, M.E., Sinars, D.B., Mazarakis, M.G., Leckbee, J.J., Savage, M.E., Hutsel, B.T., Douglass, J.D., Kiefer, M.L., Oliver, B.V., Laity, G.R., Gomez, M.R., Yager-Elorriaga, D.A., Patel, S.G., Kovalchuk, B.M., Kim, A.A., Gourdain, P., Bland, S.N., Portillo, S., Bott-Suzuki, S.C., Beg, F.N., Maron, Y., Spielman, R.B., Rose, D.V., Welch, D.R., Zier, J.C., Schumer, J.W., Greenly, J.B., Covington, A.M., Steiner, A.M., Campbell, P.C., Miller, S.M., Woolstrum, J.M., Ramey, N.B., Shah, A.P., Sporer, B.J., Jordan, N.M., Lau, Y.Y., Gilgenbach, R.M.
المصدر: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 46(11):3928-3967 Nov, 2018
-
6دورية أكاديمية
المؤلفون: Shah, A.P., Yadav, N., Beohar, A., Vishvakarma, S.K.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 18(4):546-554 Dec, 2018
-
7مؤتمر
المؤلفون: Paine, B.M., Shah, A.P., Rust, T., III
المصدر: GaAs Reliability 2002 Workshop GaAs reliability GaAs Reliability Workshop, 2002. :45-68 2002
Relation: 2002 GaAs Reliability Workshop. Proceedings
-
8دورية أكاديمية
المؤلفون: Shah, A.P., Yadav, N., Beohar, A., Vishvakarma, S.K.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 31(2):242-249 May, 2018
-
9دورية أكاديمية
المؤلفون: Yadav, N., Shah, A.P., Vishvakarma, S.K.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 30(3):276-284 Aug, 2017
-
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.
Full Text Finder