المؤلفون: Wann, C., Wong, R., Frank, D.J., Mann, R., Shang-Bin Ko, Croce, P., Lea, D., Hoyniak, D., Yoo-Mi Lee, Toomey, J., Weybright, M., Sudijono, J.

المصدر: IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech). VLSI Technology VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on. :21-22 2005

Relation: 2005 IEEE VLSI-TSA. International Symposium on VLSI Technology (VLSI-TSA-TECH)

المؤلفون: Shang-Bin Ko, Henderson, H.T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 27(1):62-65 Jan, 1980

المؤلفون: Shang-Bin Ko, Harold Pilo, Igor Arsovski, Steve Lamphier, Geordie Braceras, John A. Gabric, Robert M. Houle, Liang-Yu Chen, Frank Pavlik, Kevin A. Batson, Adnan Seferagic, Carl J. Radens

المصدر: ISSCC

مصطلحات موضوعية: Reduction (complexity), Footprint (electronics), Engineering, business.industry, Logic gate, Electrical engineering, Silicon on insulator, Equivalent oxide thickness, Static random-access memory, Electrical and Electronic Engineering, business, High-κ dielectric, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6e00adef1df24ac08c58888c509594a
https://doi.org/10.1109/jssc.2011.2164730

المؤلفون: Harold Pilo, Igor Arsovski, Kevin Batson, Geordie Braceras, John Gabric, Robert Houle, Steve Lamphier, Frank Pavlik, Adnan Seferagic, Liang-Yu Chen, Shang-Bin Ko, Carl Radens

المصدر: 2011 IEEE International Solid-State Circuits Conference.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88fcbc4924e84ad61edcf7c35e5d6c39
https://doi.org/10.1109/isscc.2011.5746307

المؤلفون: J. Toomey, D. Hoyniak, Randy W. Mann, D. Lea, M. Weybright, C. Wann, Yoo-Mi Lee, Shang-Bin Ko, Robert C. Wong, P. Croce, David J. Frank, J. Sudijono

المصدر: IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech)..

مصطلحات موضوعية: Engineering, business.industry, Spice, Sram cell, Redundancy (engineering), Electronic engineering, Sigma, Figure of merit, Integrated circuit design, Static random-access memory, business, Scaling, Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::56fb8d516c6b82aa9b3fc45214f8e21e
https://doi.org/10.1109/vtsa.2005.1497065

المؤلفون: Pilo, H., Arsovski, I., Batson, K., Braceras, G., Gabric, J., Houle, R., Lamphier, S., Pavlik, F., Seferagic, A., Liang-Yu Chen, Shang-Bin Ko, Radens, C.

المصدر: 2011 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC); 2011, p254-256, 3p

المؤلفون: Shang-Bin Ko

المصدر: IEEE Transactions on Nuclear Science. 27:1500-1505

مصطلحات موضوعية: Time delay and integration, Physics, Nuclear and High Energy Physics, business.industry, Alpha particle, Radiation, Threshold voltage, Soft error, Nuclear Energy and Engineering, Optoelectronics, Irradiation, Electrical and Electronic Engineering, Image sensor, Atomic physics, business, Order of magnitude

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::16df57343df70cbcf25714dddef9c6b0
https://doi.org/10.1109/tns.1980.4331059

المؤلفون: H.T. Henderson, Shang-Bin Ko

المصدر: IEEE Transactions on Electron Devices. 27:62-65

مصطلحات موضوعية: Total internal reflection, Materials science, Silicon, Physics::Instrumentation and Detectors, business.industry, Photoconductivity, Detector, chemistry.chemical_element, Electronic, Optical and Magnetic Materials, Optics, chemistry, Optoelectronics, Quantum efficiency, Wafer, Infrared detector, Electrical and Electronic Engineering, business, Absorption (electromagnetic radiation)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6a06ba28e8a55845a457684311cbae81
https://doi.org/10.1109/t-ed.1980.19820

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