المؤلفون: Tang, Xiaoyang, Cao, Zhang, Wang, Zhonghong, Xie, Heng, Xu, Lijun

المصدر: 2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2021 IEEE International. :1-5 May, 2021

Relation: 2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Rustad, Matthew L., Hamilton, Andrew J., Caplinger, James E., Sotnikov, Vladimir I.

المصدر: 2022 IEEE Research and Applications of Photonics in Defense Conference (RAPID) Photonics in Defense Conference (RAPID), 2022 IEEE Research and Applications of. :1-2 Sep, 2022

Relation: 2022 IEEE Research and Applications of Photonics in Defense Conference (RAPID)

المؤلفون: Tang, X., Cao, Z., Wang, Z., Xie, H., Xu, L.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-12 2021

المؤلفون: Akanksha Gautam, Dinesh N. Naik, C. S. Narayanamurthy, Rakesh Kumar Singh

المصدر: Photonics, Vol 11, Iss 2, p 142 (2024)

مصطلحات موضوعية: coherence, polarization, cross-spectral density (CSD) matrix, shearing interferometer, phase-shifting technique, Applied optics. Photonics, TA1501-1820

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2304-6732/11/2/142; https://doaj.org/toc/2304-6732

URL الوصول: https://doaj.org/article/a6702144cc564c9192d3809134d2e8e1

المؤلفون: Sun, Tengfei, Lu, Peng, Zhuo, Zhuang, Zhang, Wenhao, Lu, Jingqi

المصدر: 2018 Asia Communications and Photonics Conference (ACP) Asia Communications and Photonics Conference (ACP), 2018. :1-3 Oct, 2018

Relation: 2018 Asia Communications and Photonics Conference (ACP)

المؤلفون: Yeh, Feng-Ming, Chen, Der-Chin, Tien, Chuen-Lin, Lee, Shih-Chieri

المصدر: 2015 Optoelectronics Global Conference (OGC) Optoelectronics Global Conference (OGC), 2015. :1-4 Aug, 2015

Relation: 2015 Optoelectronics Global Conference (OGC)

المؤلفون: Sysoev, E. V.^{Aff1, IDS8756699021060157_cor1}, Latyshev, A. V.^{Aff2, IDS8756699021060157_cor2}

المصدر: Optoelectronics, Instrumentation and Data Processing. 57(6):561-568

المؤلفون: Kim, Kyung-Suk^Aff5, Jin, Hanxun^Aff5, Jiao, Tong^Aff6, Clifton, Rodney J.^Aff6

المساهمون: Zimmerman, Kristin B., Series Editor^Aff1, Xia, Shuman, editor^Aff2, Beese, Allison, editor^Aff3, Berke, Ryan B., editor^Aff4

المصدر: Fracture, Fatigue, Failure and Damage Evolution , Volume 3 : Proceedings of the 2020 Annual Conference on Experimental and Applied Mechanics. :97-100

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