المؤلفون: Ming-Shan Shieh, Chih-Yang Chen, Yuan-Jiun Hsu, Shen-De Wang, Tan-Fu Lei

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :711-712 Mar, 2006

Relation: 2006 IEEE International Reliability Physics Symposium Proceedings

المؤلفون: Shen De Wang, Tzu Yun Chang, Chao Hsin Chien, Wei Hsiang Lo, Jen Yi Sang, Jam Wen Lee, Tan Fu Lei

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(7):467-469 Jul, 2005

المؤلفون: Shen-De Wang, Wei-Hsiang Lo, Tzu-Yun Chang, Tan-Fu Lei

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(6):372-374 Jun, 2005

المؤلفون: Shen De Wang, Tzu Yun Chang, Wei Hsiang Lo, Tan Fu Lei

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :702-703 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Hua-wei Zheng, Shen-de Wang, Jian-feng Zhou, Bo Zhang, Zhi Liao, Zhengliang Xue

المصدر: Journal of Iron and Steel Research, International. 21:108-112

مصطلحات موضوعية: Surface (mathematics), Materials science, Scanning electron microscope, Metallurgy, Metals and Alloys, Shell (structure), Stress (mechanics), Cracking, Mechanics of Materials, mental disorders, Microscopy, Tearing, Materials Chemistry, Slab

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6058ce79014a3324ba6234a5529f17b0
https://doi.org/10.1016/s1006-706x(14)60132-1

المؤلفون: Tsung-Min Hsieh, Hwi-Huang Chen, Tzu-Ping Chen, Chien-Hsing Lee, Wen Luh Yang, Woei-Cherng Wu, Shen-De Wang, Chih-Hung Lin, Chien-Hung Chen, Tien-Sheng Chao, Kuan-Ti Wang, Jhyy-Cheng Liou

المصدر: IEEE Transactions on Electron Devices. 57:2335-2338

مصطلحات موضوعية: Bit cell, Materials science, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Circuit reliability, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, Reliability (semiconductor), Gate oxide, law, Logic gate, Electronic engineering, Electrical and Electronic Engineering, Simulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fef8328d4eff92cbe9df718e41b455f2
https://doi.org/10.1109/ted.2010.2054530

المؤلفون: Po-Hao Lee, Kuan-Lin Yeh, Hsiao-Yi Lin, Tan-Fu Lei, Chih-Yang Chen, Shen-De Wang, Wei-Cheng Chen, Ming-Shan Shieh, Jam-Wem Lee

المصدر: IEEE Transactions on Electron Devices. 53:2993-3000

مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Condensed matter physics, Silicon, business.industry, Low-temperature polycrystalline silicon, Electrical engineering, Dangling bond, chemistry.chemical_element, engineering.material, Electronic, Optical and Magnetic Materials, Stress (mechanics), Polycrystalline silicon, chemistry, Thin-film transistor, MOSFET, engineering, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed56a68e5d716484f3f3f8f4a025aabc
https://doi.org/10.1109/ted.2006.885543

المؤلفون: Jen Yi Sang, Shen De Wang, Tan Fu Lei, Ming−Shan Shieh, Chih-Yang Chen

المصدر: Japanese Journal of Applied Physics. 45:3159-3164

مصطلحات موضوعية: Fabrication, Materials science, Physics and Astronomy (miscellaneous), business.industry, Transistor, General Engineering, General Physics and Astronomy, Hardware_PERFORMANCEANDRELIABILITY, engineering.material, law.invention, Threshold voltage, Impact ionization, Reliability (semiconductor), Polycrystalline silicon, Hardware_GENERAL, Thin-film transistor, law, Electric field, Hardware_INTEGRATEDCIRCUITS, engineering, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c47d7de3471864ec96eb0158420546a1
https://doi.org/10.1143/jjap.45.3159

المؤلفون: Kuan-Ti Wang, Tien-Sheng Chao, Tsung-Min Hsieh, Shen-De Wang, Chih-Hung Lin, Jhyy-Cheng Liou, Tsung-Yu Chiang, Hwi-Huang Chen, Tzu-Ping Chen, Chien-Hsing Lee, Yi-Hong Wu, Chien-Hung Chen, Woei-Cherng Wu, Wen Luh Yang

المصدر: IEEE Electron Device Letters. 30:659-661

مصطلحات موضوعية: Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Programming method, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, Dynamic programming, law, Gate oxide, Low-power electronics, MOSFET, Electronic engineering, Electrical and Electronic Engineering, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5f2659ee1f44c7c73170dd5bed9bc6b4
https://doi.org/10.1109/led.2009.2019255

المؤلفون: Chih-Yang Chen, Ming-Wen Ma, Hsiao-Yi Lin, Kuan-Lin Yeh, Shen-De Wang, Wei-Cheng Chen, Tan-Fu Lei

المصدر: IEEE Electron Device Letters. 29:165-167

مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Silicon, business.industry, Low-temperature polycrystalline silicon, Transistor, Oxide, Electrical engineering, chemistry.chemical_element, engineering.material, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Polycrystalline silicon, chemistry, Thin-film transistor, law, engineering, Optoelectronics, Grain boundary, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::588497cb1e840878b1d5024831162e7a
https://doi.org/10.1109/led.2007.914083