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1مؤتمر
المؤلفون: Ming-Shan Shieh, Chih-Yang Chen, Yuan-Jiun Hsu, Shen-De Wang, Tan-Fu Lei
المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :711-712 Mar, 2006
Relation: 2006 IEEE International Reliability Physics Symposium Proceedings
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2دورية أكاديمية
المؤلفون: Shen De Wang, Tzu Yun Chang, Chao Hsin Chien, Wei Hsiang Lo, Jen Yi Sang, Jam Wen Lee, Tan Fu Lei
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(7):467-469 Jul, 2005
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3دورية أكاديمية
المؤلفون: Shen-De Wang, Wei-Hsiang Lo, Tzu-Yun Chang, Tan-Fu Lei
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(6):372-374 Jun, 2005
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4مؤتمر
المؤلفون: Shen De Wang, Tzu Yun Chang, Wei Hsiang Lo, Tan Fu Lei
المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :702-703 2005
Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual
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5
المؤلفون: Hua-wei Zheng, Shen-de Wang, Jian-feng Zhou, Bo Zhang, Zhi Liao, Zhengliang Xue
المصدر: Journal of Iron and Steel Research, International. 21:108-112
مصطلحات موضوعية: Surface (mathematics), Materials science, Scanning electron microscope, Metallurgy, Metals and Alloys, Shell (structure), Stress (mechanics), Cracking, Mechanics of Materials, mental disorders, Microscopy, Tearing, Materials Chemistry, Slab
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6
المؤلفون: Tsung-Min Hsieh, Hwi-Huang Chen, Tzu-Ping Chen, Chien-Hsing Lee, Wen Luh Yang, Woei-Cherng Wu, Shen-De Wang, Chih-Hung Lin, Chien-Hung Chen, Tien-Sheng Chao, Kuan-Ti Wang, Jhyy-Cheng Liou
المصدر: IEEE Transactions on Electron Devices. 57:2335-2338
مصطلحات موضوعية: Bit cell, Materials science, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Circuit reliability, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, Reliability (semiconductor), Gate oxide, law, Logic gate, Electronic engineering, Electrical and Electronic Engineering, Simulation
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7
المؤلفون: Po-Hao Lee, Kuan-Lin Yeh, Hsiao-Yi Lin, Tan-Fu Lei, Chih-Yang Chen, Shen-De Wang, Wei-Cheng Chen, Ming-Shan Shieh, Jam-Wem Lee
المصدر: IEEE Transactions on Electron Devices. 53:2993-3000
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Condensed matter physics, Silicon, business.industry, Low-temperature polycrystalline silicon, Electrical engineering, Dangling bond, chemistry.chemical_element, engineering.material, Electronic, Optical and Magnetic Materials, Stress (mechanics), Polycrystalline silicon, chemistry, Thin-film transistor, MOSFET, engineering, Electrical and Electronic Engineering, business
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8
المؤلفون: Jen Yi Sang, Shen De Wang, Tan Fu Lei, Ming−Shan Shieh, Chih-Yang Chen
المصدر: Japanese Journal of Applied Physics. 45:3159-3164
مصطلحات موضوعية: Fabrication, Materials science, Physics and Astronomy (miscellaneous), business.industry, Transistor, General Engineering, General Physics and Astronomy, Hardware_PERFORMANCEANDRELIABILITY, engineering.material, law.invention, Threshold voltage, Impact ionization, Reliability (semiconductor), Polycrystalline silicon, Hardware_GENERAL, Thin-film transistor, law, Electric field, Hardware_INTEGRATEDCIRCUITS, engineering, Optoelectronics, business
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9
المؤلفون: Kuan-Ti Wang, Tien-Sheng Chao, Tsung-Min Hsieh, Shen-De Wang, Chih-Hung Lin, Jhyy-Cheng Liou, Tsung-Yu Chiang, Hwi-Huang Chen, Tzu-Ping Chen, Chien-Hsing Lee, Yi-Hong Wu, Chien-Hung Chen, Woei-Cherng Wu, Wen Luh Yang
المصدر: IEEE Electron Device Letters. 30:659-661
مصطلحات موضوعية: Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Programming method, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, Dynamic programming, law, Gate oxide, Low-power electronics, MOSFET, Electronic engineering, Electrical and Electronic Engineering, business, Voltage
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10
المؤلفون: Chih-Yang Chen, Ming-Wen Ma, Hsiao-Yi Lin, Kuan-Lin Yeh, Shen-De Wang, Wei-Cheng Chen, Tan-Fu Lei
المصدر: IEEE Electron Device Letters. 29:165-167
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Silicon, business.industry, Low-temperature polycrystalline silicon, Transistor, Oxide, Electrical engineering, chemistry.chemical_element, engineering.material, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Polycrystalline silicon, chemistry, Thin-film transistor, law, engineering, Optoelectronics, Grain boundary, Electrical and Electronic Engineering, business