المؤلفون: Jiunn-Ren Hwang, Tsung-Lin Lee, Huan-Chi Ma, Tzyh-Cheang Lee, Tang-Hsuan Chung, Chang-Yun Chang, Sheng-Da Liu, Baw-Ching Perng, Ju-Wang Hsu, Ming-Yong Lee, Chih-Yuan Ting, Chien-Chao Huang, Ji-Hua Wang, Jyu-Horng Shieh, Fu-Liang Yang

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :154-157 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Sheng-Da Liu, Si-Chen Lee

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(2):166-171 Feb, 2004

المؤلفون: Sheng-Da Liu, Si-Chen Lee, Ming-Yau Chern

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 48(8):1564-1567 Aug, 2001

المؤلفون: Hou-Yu Chen, Chang-Yun Chang, Chien-Chao Huang, Tang-Xuan Chung, Sheng-Da Liu, Jiunn-Ren HwangYi-Hsuan Liu, Yu-Jun Chou, Hong-Jang Wu, King-Chang Shu, Chung-Kan Huang, Jan-Wen You, Jaw-Jung Shin, Chun-Kuang Chen, Chia-Hui Lin, Ju-Wang Hsu, Bao-Chin Perng, Pang-Yen Tsai, Chi-Chun Chen, Jyu-Horng Shieh, Han-Jan Tao, Shin-Chang Chen, Tsai-Sheng Gau, Fu-Liang Yang

المصدر: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. VLSI Technology VLSI Technology, 2005. Digest of Technical Papers. 2005 Symposium on. :16-17 2005

Relation: 2005 Symposium on VLSI Technology

المؤلفون: Fu-Liang Yang, Cheng-Chuan Huang, Chien-Chao Huang, Tang-Xuan Chung, Hou-Yu Chen, Chang-Yun Chang, Hung-Wei Chen, Di-Hong Lee, Sheng-Da Liu, Kuang-Hsin Chen, Cheng-Kuo Wen, Shui-Ming Cheng, Chang-Ta Yang, Li-Wei Kung, Chiu-Lien Lee, Yu-Jun Chou, Fu-Jye Liang, Lin-Hung Shiu, Jan-Wen You, King-Chang Shu, Bin-Chang Chang, Jaw-Jung Shin, Chun-Kuang Chen, Tsai-Sheng Gau, Ping-Wei Wang, Bor-Wen Chan, Peng-Fu Hsu, Jyu-Honig Shieh, Fung, S.K.-H., Diaz, C.H., Wu, C.-M.M., Yee-Chaung See, Lin, B.J., Liang, M.-S., Sun, J.Y.-C., Chenming Hu

المصدر: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :8-9 2004

Relation: 2004 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Fu-Liang Yang, Di-Hong Lee, Hou-Yu Chen, Chang-Yun Chang, Sheng-Da Liu, Cheng-Chuan Huang, Tang-Xuan Chung, Hung-Wei Chen, Chien-Chao Huang, Yi-Hsuan Liu, Chung-Cheng Wu, Chi-Chun Chen, Shih-Chang Chen, Ying-Tsung Chen, Ying-Ho Chen, Chih-Jian Chen, Bor-Wen Chan, Peng-Fu Hsu, Jyu-Horng Shieh, Han-Jan Tao, Yee-Chia Yeo, Yiming Li, Jam-Wem Lee, Pu Chen, Mong-Song Liang, Chenming Hu

المصدر: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :196-197 2004

Relation: 2004 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Xiaohua Wang, Dengkui Wang, Cheng-lin Li, Zhipeng Wei, Dan Fang, Sheng-da Liu, Dongbo Wang, Hongbin Zhao, Xuan Fang, Xiao-hui Ma

المصدر: Chinese Journal of Luminescence. 42:165-186

مصطلحات موضوعية: Radiation, Materials science, business.industry, Superlattice, Antimonide, Optoelectronics, Condensed Matter Physics, business, Epitaxy, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c1bd3c0969c37774591f5e920186a7aa
https://doi.org/10.37188/cjl.20200304

المؤلفون: L.-S. Jeng, Yi-Shao Liu, Ming-Jer Chen, Yang Jing-Hwang, C. K. Yang, Tsui Felix Ying-Kit, Yi-Chun Huang, Tung-Tsun Chen, Jui-Cheng Huang, Chin-Hua Wen, C. H. Hsieh, C.-C. Lin, Sheng-Da Liu

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Hysteresis, Materials science, Signal-to-noise ratio (imaging), CMOS, law, Logic gate, Transistor, Electronic engineering, Biasing, ISFET, Sensitivity (electronics), law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d74a1c3577c92fce4e22962e46fbc797
https://doi.org/10.1109/iedm.2015.7409792

المؤلفون: K.-Y. Roy Wong, Chen Po-Chih, C. B. Wu, Ching-Ray Chen, C. W. Hsiung, Ming-Huei Lin, F. J. Yang, Liao Yan-Jie, M. W. Tsai, Yani Lai, Chiu Hsien-Kuang, Tom Tsai, Man-Ho Kwan, Sheng-Da Liu, Burn Jeng Lin, Chang Yu-Chi, Jan-Wen You, Alex Kalnitsky, Chen-Shien Chen, M.-H. Chang, J. L. Yu, L. Y. Tsai, Yu-Syuan Lin, P.-C. Liu, Ru-Yi Su, Fu-Wei Yao, H. C. Tuan, L. C. Chen, Haw-Yun Wu, K.-L. Chiu, Chia-Shiung Tsai, Chung-Yi Yu, S.-P. Wang, G. P. Lansbergen, Chiang Chen-Hao

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Materials science, business.industry, Transistor, Schottky diode, Gallium nitride, Capacitance, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Optoelectronics, business, MISFET, AND gate, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7faa0d215059670d3d4fc905d6e081b
https://doi.org/10.1109/iedm.2015.7409663

المؤلفون: Sheng Da Liu, Yu Ren Yang

المصدر: Applied Mechanics and Materials. :4668-4678

مصطلحات موضوعية: Place making, Architectural engineering, Engineering, Management science, business.industry, Urban planning, General Medicine, Space (commercial competition), Construct (philosophy), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cccbb789d4eba64700bcb7dd7882986d
https://doi.org/10.4028/www.scientific.net/amm.71-78.4668