المؤلفون: Arimura, H., Brus, S., Franco, J., Oniki, Y., Vandooren, A., Conard, T., Chan, B.-T., Kannan, B., Samiee, M., Li, W., Deminskyi, P., Shero, E., Bakke, J., Jourdan, N., Verni, G. Alessio, Maes, J. W., Givens, M., Ragnarsson, L.-A., Mitard, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Verma, N.K., Ce Ma, Shero, E., Shadman, F.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 9(3):312-319 Aug, 1996

المؤلفون: Hergenrother, J.M., Wilk, G.D., Nigam, T., Klemens, F.P., Monroe, D., Silverman, P.J., Sorsch, T.W., Busch, B., Green, M.L., Baker, M.R., Boone, T., Bude, M.K., Ciampa, N.A., Ferry, E.J., Fiory, A.T., Hillenius, S.J., Jacobson, D.C., Johnson, R.W., Kalavade, P., Keller, R., King, C.A., Kornblit, A., Krautter, H.W., Lee, J.T.-C., Mansfield, W.M., Miner, J.F., Morris, M.D., Oh, S.-H., Rosamilia, J.M., Sapjeta, B.J., Short, K., Steiner, K., Muller, D.A., Voyles, P.M., Grazul, J.L., Shero, E., Givens, M.E., Pomarede, C., Mazanec, M., Werkhoven, C.

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :3.1.1-3.1.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Yudong Kim, Gebara, G., Freiler, M., Barnett, J., Riley, D., Chen, J., Torres, K., JaeEun Lim, Foran, B., Shaapur, F., Agarwal, A., Lysaght, P., Brown, G.A., Young, C., Borthakur, S., Hong-Jyh Li, Nguyen, B., Zeitzoff, P., Bersuker, G., Derro, D., Bergmann, R., Murto, R.W., Hou, A., Huff, H.R., Shero, E., Pomarede, C., Givens, M., Mazanez, M., Werkhoven, C.

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :20.2.1-20.2.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Dey, S. K., Wang, C.-G., Tang, D., Kim, M. J., Carpenter, R. W., Werkhoven, C., Shero, E.

المصدر: Journal of Applied Physics; 4/1/2003, Vol. 93 Issue 7, p4144, 14p, 3 Black and White Photographs, 2 Diagrams, 3 Charts, 7 Graphs

مصطلحات موضوعية: CHEMICAL vapor deposition, ZIRCONIUM oxide, DIELECTRIC films, NANOSTRUCTURED materials

المؤلفون: Smith, K. H., Shero, E., Chizmeshya, A., Wolf, G. H.

المصدر: Journal of Chemical Physics; 5/1/1995, Vol. 102 Issue 17, p6851, 7p, 4 Graphs

مصطلحات موضوعية: METALLIC glasses, EQUATIONS of state, GERMANIUM, METAL clusters

المؤلفون: Fourmun Lee, Marcus, S., Shero, E., Wilk, G., Swerts, J., Maes, J.W., Blomberg, T., Delabie, A., Gros-Jean, M., Deloffre, E.

المصدر: 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference; 2007, p359-365, 7p

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