المؤلفون: Yang, S.H., Sheu, J.Y., Ieong, M.K., Chiang, M.H., Yamamoto, T., Liaw, J.J., Chang, S.S., Lin, Y.M., Hsu, T.L., Hwang, J.R., Ting, J.K., Wu, C.H., Ting, K.C., Yang, F.C., Liu, C.M., Wu, I.L., Chen, Y.M., Chent, S.J., Chen, K.S., Cheng, J.Y., Tsai, M.H, Chang, W., Chen, R., Chen, C.C., Lee, T.L., Lin, C.K, Yang, S.C., Sheu, Y.M., Tzeng, J.T., Lu, L.C., Jang, S.M, Diaz, C.H., Mii, YJ

المصدر: 2011 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2011 IEEE. :1-5 Sep, 2011

Relation: 2011 IEEE Custom Integrated Circuits Conference - CICC 2011

المؤلفون: Shih, J.R., Wang, R., Sheu, Y.M., Lin, H.C., Wang, J.J., Wu, K.

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :489-492 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Sheu, Y.M., Chang, C.S., Lin, H.C., Lin, S.S., Lee, C.H., Wu, C.C., Chen, M.J., Diaz, C.H.

المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :76-79 2003

Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers

المؤلفون: Sheu, Y.M., Doong, K.Y.Y., Lee, C.H., Chen, M.J., Diaz, C.H.

المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :205-208 2003

Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures

المؤلفون: Wu, C.C., Leung, Y.K., Chang, C.S., Tsai, M.H., Huang, H.T., Lin, D.W., Sheu, Y.M., Hsieh, C.H., Liang, W.J., Han, L.K., Chen, W.M., Chang, S.Z., Wu, S.Y., Lin, S.S., Lin, H.C., Wang, C.H., Wang, P.W., Lee, T.L., Fu, C.Y., Chang, C.W., Chen, S.C., Jang, S.M., Shue, S.L., Lin, H.T., See, Y.C., Mii, Y.J., Diaz, C.H., Lin, B.J., Liang, M.S., Sun, Y.C.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :65-68 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Wang, C.C., Sheu, Y.M., Liu, Sally, Duffy, R., Heringa, A., Cowern, N.E.B., Griffin, P.B.

المصدر: In Materials Science & Engineering B 2005 124:39-44

المؤلفون: Fried, H.M., Sheu, Y.M., Tsang, P.H., Gabellini, Y., Grandou, T.

المساهمون: Institut de Physique de Nice (INPHYNI), Université Nice Sophia Antipolis (... - 2019) (UNS), Université Côte d'Azur (UCA)-Université Côte d'Azur (UCA)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Université Côte d'Azur (UCA)-Université Nice Sophia Antipolis (... - 2019) (UNS), COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)

المصدر: 18th Conference on Elastic and Diffractive Scattering
18th Conference on Elastic and Diffractive Scattering, Jun 2019, Quy Nhon, Vietnam

مصطلحات موضوعية: High Energy Physics - Theory, Physics::Instrumentation and Detectors, fluctuation, [PHYS.HTHE]Physics [physics]/High Energy Physics - Theory [hep-th], High Energy Physics::Lattice, High Energy Physics::Phenomenology, FOS: Physical sciences, nonperturbative, quark, High Energy Physics - Phenomenology, transverse, High Energy Physics - Phenomenology (hep-ph), High Energy Physics - Theory (hep-th), pomeron, [PHYS.HPHE]Physics [physics]/High Energy Physics - Phenomenology [hep-ph], quantum chromodynamics, invariance: gauge, High Energy Physics::Experiment, p p: elastic scattering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2867aaf4a84cd9166832feb47e0d96d8
https://hal.archives-ouvertes.fr/hal-02338363

المؤلفون: Lin, T.Y ^∗, Sheu, Y.M, Chen, Y.F, Lin, J.Y, Jiang, H.X

المصدر: In Solid State Communications 2004 131(6):389-392

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المؤلفون: Sheu, Y.M., Trigo, M., Chien, Y.J., Uher, C., Arms, D.A., Peterson, E.R., Walko, D.A., Landahl, E.C., Chen, J., Ghimire, S., Reis, D.A.

المصدر: In Solid State Communications 2011 151(11):826-829