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1مؤتمر
المؤلفون: Jin, Yan, Hu, Yuxiao, Shi, Chaoqun, He, Guanghua, Qi, Jinlong, Xu, Yang
المصدر: 2024 IEEE 5th International Conference on Dielectrics (ICD) Dielectrics (ICD), 2024 IEEE 5th International Conference on. :1-4 Jun, 2024
Relation: 2024 IEEE 5th International Conference on Dielectrics (ICD)
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2مؤتمرResearch on the Influence of Auto-Reclosing for Grounding Arc Fault in Cable Tunnel Fire Development
المؤلفون: Wang, Yisong, Shi, Chaoqun, Zheng, Jiankang, Xu, Yang
المصدر: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2023 IEEE Conference on. :1-4 Oct, 2023
Relation: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
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3كتاب إلكتروني
المؤلفون: Wang, YisongAff38, Shi, ChaoqunAff38, Xu, YangAff38
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Chakraborty, Samarjit, Series EditorAff3, Chen, Jiming, Series EditorAff4, Chen, Shanben, Series EditorAff5, Chen, Tan Kay, Series EditorAff6, Dillmann, Rüdiger, Series EditorAff7, Duan, Haibin, Series EditorAff8, Ferrari, Gianluigi, Series EditorAff9, Ferre, Manuel, Series EditorAff10, Jabbari, Faryar, Series EditorAff11, Jia, Limin, Series EditorAff12, Kacprzyk, Janusz, Series EditorAff13, Khamis, Alaa, Series EditorAff14, Kroeger, Torsten, Series EditorAff15, Li, Yong, Series EditorAff16, Liang, Qilian, Series EditorAff17, Martín, Ferran, Series EditorAff18, Ming, Tan Cher, Series EditorAff19, Minker, Wolfgang, Series EditorAff20, Misra, Pradeep, Series EditorAff21, Mukhopadhyay, Subhas, Series EditorAff22, Ning, Cun-Zheng, Series EditorAff23, Nishida, Toyoaki, Series EditorAff24, Oneto, Luca, Series EditorAff25, Panigrahi, Bijaya Ketan, Series EditorAff26, Pascucci, Federica, Series EditorAff27, Qin, Yong, Series EditorAff28, Seng, Gan Woon, Series EditorAff29, Speidel, Joachim, Series EditorAff30, Veiga, Germano, Series EditorAff31, Wu, Haitao, Series EditorAff32, Zamboni, Walter, Series EditorAff33, Zhang, Junjie James, Series EditorAff34, Tan, Kay Chen, Series EditorAff35, Dong, Xuzhu, editorAff36, Cai, Li, editorAff37
المصدر: The Proceedings of 2023 4th International Symposium on Insulation and Discharge Computation for Power Equipment (IDCOMPU2023) : Volume I. 1100:603-611
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4مؤتمر
المؤلفون: Yang, Kun, Shi, Chaoqun, Guo, Yujun, Zhang, Xueqin, Li, Chunmao, Wu, Guangning
المصدر: 2021 International Conference on Electrical Materials and Power Equipment (ICEMPE) Electrical Materials and Power Equipment (ICEMPE), 2021 International Conference on. :1-4 Apr, 2021
Relation: 2021 International Conference on Electrical Materials and Power Equipment (ICEMPE)
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5دورية أكاديمية
المؤلفون: Luo, Bairu, Zheng, Rui, Shi, Chaoqun, Chen, Deqing, Jin, Xin, Hou, Jian, Xu, Guangtao, Hu, Bo
المصدر: In Heliyon 30 August 2024 10(16)
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6دورية أكاديمية
المؤلفون: Kang, Qi, Zhuang, Zechao, Li, Yong, Zuo, Yinze, Wang, Jian, Liu, Yijie, Shi, Chaoqun, Chen, Jie, Li, Hongfei, Jiang, Pingkai, Huang, XingyiAff1, IDs1227402354784_cor11
المصدر: Nano Research. 16(7):9240-9249
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7دورية أكاديمية
المؤلفون: Shi, Chaoqun, Li, Hao, Lv, Huixian, Liu, Jingyan, Sun, Di, Dong, Huoxiang, Zhou, Siyu, Cheng, Ming, Cao, Shaofang, Zhang, Xing
المصدر: In Results in Engineering March 2024 21
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8دورية أكاديمية
المؤلفون: Kang, Yongqiang, Wu, Guangning, Zhang, Xueqin, Liu, Yijie, Shi, Chaoqun, Wei, Wenfu, Gao, Guoqiang
المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 26(4):1048-1055 Aug, 2019
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9دورية أكاديمية
المؤلفون: Kang, Yongqiang, Wu, Guangning, Zhang, Xueqin, Liu, Yijie, Shi, Chaoqun, Wei, Wenfu, Gao, Guoqiang
المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 26(4):1056-1064 Aug, 2019
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10مؤتمر
المؤلفون: Shi, Chaoqun, Kang, Yongqiang, Zhang, Xueqin, Wu, Gaugnning
المصدر: 2017 IEEE Electrical Insulation Conference (EIC) Electrical Insulation Conference (EIC), 2017 IEEE. :317-320 Jun, 2017
Relation: 2017 IEEE Electrical Insulation Conference (EIC)