يعرض 1 - 10 نتائج من 56 نتيجة بحث عن '"Shianling Wu"', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2005 International Conference on Computer Design Computer Design Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on. :475-478 2005

    Relation: Proceedings. 2005 International Conference on Computer Design

  2. 2
    مؤتمر

    المصدر: 2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :916-925 2004

    Relation: Proceedings. International Test Conference 2004

  3. 3
    مؤتمر

    المصدر: Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) International test conference Test Conference, 1998. Proceedings., International. :934-943 1998

    Relation: Proceedings International Test Conference 1998

  4. 4
    مؤتمر

    المصدر: Proceedings of the Fifth Asian Test Symposium (ATS'96) Asian test symposium Test Symposium, 1996., Proceedings of the Fifth Asian. :251-256 1996

    Relation: Proceedings of the Fifth Asian Test Symposium (ATS'96)

  5. 5
    مؤتمر

    المصدر: 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on. :143-151 Oct, 2008

    Relation: 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS)

  6. 6
    مؤتمر

    المصدر: 2006 IEEE International Test Conference Test Conference, 2006. ITC '06. IEEE International. :1-10 Oct, 2006

    Relation: 2006 IEEE International Test Conference

  7. 7
    دورية أكاديمية

    المصدر: IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 15(1):83-90 Jan, 1998

  8. 8
    مؤتمر

    المصدر: IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :8 pp.-953 2005

    Relation: 2005 IEEE International Test Conference

  9. 9
    مؤتمر

    المصدر: IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :2 pp.-1285 2005

    Relation: 2005 IEEE International Test Conference

  10. 10
    مؤتمر

    المصدر: Proceedings of the Ninth Asian Test Symposium Asian test symposium Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian. :17-17 2000

    Relation: Proceedings of the Ninth Asian Test Symposium