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1مؤتمر
المؤلفون: Wang, L.T., Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Guo, J.
المصدر: 2005 International Conference on Computer Design Computer Design Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on. :475-478 2005
Relation: Proceedings. 2005 International Conference on Computer Design
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2مؤتمر
المؤلفون: Wang, L.-T., Xiaoqing Wen, Furukawa, H., Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai, Abdel-Hafez, K.S., Shianling Wu
المصدر: 2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :916-925 2004
Relation: Proceedings. International Test Conference 2004
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3مؤتمر
المؤلفون: Parodi, C.G., Agrawal, V.D., Bushnell, M.L., Shianling Wu
المصدر: Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) International test conference Test Conference, 1998. Proceedings., International. :934-943 1998
Relation: Proceedings International Test Conference 1998
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4مؤتمر
المؤلفون: Jarwala, N., Rutkowski, P.W., Shianling Wu, Chi Yau
المصدر: Proceedings of the Fifth Asian Test Symposium (ATS'96) Asian test symposium Test Symposium, 1996., Proceedings of the Fifth Asian. :251-256 1996
Relation: Proceedings of the Fifth Asian Test Symposium (ATS'96)
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5مؤتمر
المؤلفون: Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Hsiao, M.S., Li, J.C.-M., Jiun-Lang Huang, Apte, R.
المصدر: 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on. :143-151 Oct, 2008
Relation: 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS)
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6مؤتمر
المؤلفون: Hiroshi Furukawa, Xiaoqing Wen, Laung-Terng Wang, Boryau Sheu, Zhigang Jiang, Shianling Wu
المصدر: 2006 IEEE International Test Conference Test Conference, 2006. ITC '06. IEEE International. :1-10 Oct, 2006
Relation: 2006 IEEE International Test Conference
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7دورية أكاديمية
المؤلفون: Butler, K., Maxwell, P., Needham, W., Nig, P., Walther, R., Shianling Wu
المصدر: IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 15(1):83-90 Jan, 1998
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8مؤتمر
المؤلفون: Laung-Terng Wang, Abdel-Hafez, K.S., Xiaoqing Wen, Sheu, B., Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang
المصدر: IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :8 pp.-953 2005
Relation: 2005 IEEE International Test Conference
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9مؤتمر
المؤلفون: Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu
المصدر: IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :2 pp.-1285 2005
Relation: 2005 IEEE International Test Conference
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10مؤتمر
المؤلفون: Kwang Ting Cheng, Agrawal, V., Jing-Yang Jou, Wang, Li.-C., Chi-Feng Wu, Shianling Wu
المصدر: Proceedings of the Ninth Asian Test Symposium Asian test symposium Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian. :17-17 2000
Relation: Proceedings of the Ninth Asian Test Symposium