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1دورية أكاديمية
المؤلفون: Frederik Westergaard Østerberg, Maria-Louise Witthøft, Shibesh Dutta, Johan Meersschaut, Christoph Adelmann, Peter Folmer Nielsen, Ole Hansen, Dirch Hjorth Petersen
المصدر: AIP Advances, Vol 8, Iss 5, Pp 055206-055206-7 (2018)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3226
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المؤلفون: Alberto Cagliani, Dirch Hjorth Petersen, Lior Shiv, Henrik Hartmann Henrichsen, Christoph Adelmann, Kasper A. Borup, Andreas R. Stilling-Andersen, Braulio Beltrán-Pitarch, Shibesh Dutta, Besira M. Mihiretie, Frederik Westergaard Østerberg, Peter Folmer Nielsen, Herman Oprins, Mikkel Fougt Hansen, Benny Guralnik, Thomas A. Marangoni, Ole Hansen, Bjorn Vermeersch
المصدر: Guralnik, B, Hansen, O, Henrichsen, H H, Beltrán-Pitarch, B, Østerberg, F W, Shiv, L, Marangoni, T A, Stilling-Andersen, A R, Cagliani, A, Hansen, M F, Nielsen, P F, Oprins, H, Vermeersch, B, Adelmann, C, Dutta, S, Borup, K A, Mihiretie, B M & Petersen, D H 2021, ' 3 ω correction method for eliminating resistance measurement error due to Joule heating ', Review of Scientific Instruments, vol. 92, no. 9, 094711 . https://doi.org/10.1063/5.0063998
Guralnik, B, Hansen, O, Henrichsen, H H, Beltrán-Pitarch, B, Østerberg, F W, Shiv, L, Marangoni, T A, Stilling-Andersen, A R, Cagliani, A, Hansen, M F, Nielsen, P F, Oprins, H, Vermeersch, B, Adelmann, C, Dutta, S, Borup, K A, Mihiretie, B M & Petersen, D H 2021, ' 3ω correction method for eliminating resistance measurement error due to Joule heating ', Review of Scientific Instruments, vol. 92, no. 9, 094711 . https://doi.org/10.1063/5.0063998مصطلحات موضوعية: Micrometre, Observational error, Materials science, Magnetoresistance, business.industry, Electrical resistivity and conductivity, Seebeck coefficient, Optoelectronics, Joule heating, business, Instrumentation, Temperature coefficient, Characterization (materials science)
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0e9a03923091f4a9bba3a7105ecbdf5e
https://pure.au.dk/portal/da/publications/3-correction-method-for-eliminating-resistance-measurement-error-due-to-joule-heating(e24b8bee-716b-4558-aa84-429794040167).html -
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المؤلفون: Jürgen Bömmels, Zsolt Tokei, Shreya Kundu, Hugo Bender, Shibesh Dutta, Wilfried Vandervorst, Sven Van Elshocht, Christoph Adelmann, Anshul Gupta, G. Jamieson, Christopher J. Wilson, Sofie Beyne
المصدر: IEEE Electron Device Letters. 39:731-734
مصطلحات موضوعية: 010302 applied physics, Interconnection, Materials science, Scattering, business.industry, Nanowire, 02 engineering and technology, Conductivity, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, Stress (mechanics), Reliability (semiconductor), Electrical resistivity and conductivity, 0103 physical sciences, Thermoelectric effect, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7d3d465ad6a7cfa6f4f733847afe46c4
https://doi.org/10.1109/led.2018.2821923
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المؤلفون: Sven Van Elshocht, Shibesh Dutta, Johan Meersschaut, Annelies Delabie, Alain Moussa, Alexis Franquet, Christoph Adelmann, Kristof Marcoen, Mihaela Popovici, Quan Manh Phung, Benjamin Groven, Kris Vanstreels, Malgorzata Jurczak, Hugo Bender, Jaap Van den Berg, P. Lagrain, Johan Swerts
المصدر: Chemistry of Materials. 29:4654-4666
مصطلحات موضوعية: 010302 applied physics, Materials science, Annealing (metallurgy), General Chemical Engineering, chemistry.chemical_element, 02 engineering and technology, General Chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Ruthenium, Atomic layer deposition, Crystallinity, chemistry, Chemical engineering, Electrical resistivity and conductivity, 0103 physical sciences, Materials Chemistry, Thin film, 0210 nano-technology, Tin, Forming gas
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المؤلفون: Nancy Heylen, Liang Gong Wen, Shibesh Dutta, Jürgen Bömmels, Sven Van Elshocht, Frederik Westergaard Østerberg, Olalla Varela Pedreira, B. Briggs, Christophe Detavernie, Mihaela Popovici, Zsolt Tőkei, Kristof Croes, Philippe Roussel, Christoph Adelmann, Christopher J. Wilson, Benjamin Groven, Dirch Hjorth Petersen, Ivan Ciofi, Kris Vanstreels, Karl Opsomer, Ole Hansen
المصدر: ACS Applied Materials & Interfaces. 8:26119-26125
مصطلحات موضوعية: 010302 applied physics, Materials science, Dielectric strength, business.industry, Annealing (metallurgy), Inorganic chemistry, Copper interconnect, chemistry.chemical_element, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Electromigration, Ruthenium, Atomic layer deposition, chemistry, 0103 physical sciences, Optoelectronics, General Materials Science, 0210 nano-technology, business, Tin
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المؤلفون: Sven Van Elshocht, Shibesh Dutta, Hao Yu, Marc Schaekers, Inge Vaesan, Antony Premkumar Peter, Alain Moussa, Erik Rosseel, Kris Paulussen
المصدر: Microelectronic Engineering. 157:52-59
مصطلحات موضوعية: 010302 applied physics, Materials science, Scanning electron microscope, Annealing (metallurgy), Analytical chemistry, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, X-ray reflectivity, chemistry.chemical_compound, chemistry, Electrical resistivity and conductivity, Transmission electron microscopy, 0103 physical sciences, Silicide, Thermal stability, Electrical and Electronic Engineering, 0210 nano-technology, Sheet resistance
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المؤلفون: Antony Premkumar Peter, Andriy Hikavvy, Sven Van Elshocht, Marc Schaekers, Shibesh Dutta, Inge Vaesen, Thomas Witters
المصدر: Microelectronic Engineering. 149:46-51
مصطلحات موضوعية: 010302 applied physics, Materials science, Scanning electron microscope, Annealing (metallurgy), Metallurgy, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Germanide, chemistry.chemical_compound, chemistry, Electrical resistivity and conductivity, 0103 physical sciences, Silicide, Thermal stability, Electrical and Electronic Engineering, Thin film, 0210 nano-technology, Sheet resistance
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المؤلفون: Juan Fernando Gomez Granados, Anshul Gupta, Jürgen Bömmels, G. Jamieson, Zsolt Tokei, Shreya Kundu, Christopher J. Wilson, Shibesh Dutta, Christoph Adelmann
المصدر: IEEE Electron Device Letters. 38:949-951
مصطلحات موضوعية: 010302 applied physics, Interconnection, Materials science, Nanowire, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, Conductivity, 021001 nanoscience & nanotechnology, 01 natural sciences, Temperature measurement, Electronic, Optical and Magnetic Materials, Ruthenium, chemistry, Electrical resistivity and conductivity, 0103 physical sciences, Electrical measurements, Electrical and Electronic Engineering, 0210 nano-technology, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::985e9026219c808b725b0de1c388d4d6
https://doi.org/10.1109/led.2017.2709248
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المؤلفون: Jean-Philippe Soulie, Christoph Adelmann, Wilfried Vandervorst, Marleen H. van der Veen, Valeria Founta, Zsolt Tokei, Geoffrey Pourtois, Christopher J. Wilson, Anshul Gupta, Ingrid De Wolf, Shreya Kundu, N. Jourdan, Marco Siniscalchi, Ivan Ciofi, Johan Swerts, Ming Mao, Shibesh Dutta, Kiroubanand Sankaran
المصدر: ECS Meeting Abstracts. :1293-1293
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المؤلفون: Kristof Moors, Kirouban Sankaran, Ivan Ciofi, Anshul Gupta, Geoffrey Pourtois, Nicolo Pinna, Christopher J. Wilson, Guillaume Boccardi, Jürgen Bömmels, Zsolt Tokei, G. Jamieson, Shibesh Dutta, Sven Van Eishocht, Shreya Kundu, Christoph Adelmann
المصدر: Proceedings of the IEEE ... International Interconnect Technology Conference
مصطلحات موضوعية: 010302 applied physics, Materials science, Ab initio, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Process maturity, Line resistance, Electrical resistivity and conductivity, 0103 physical sciences, Ab initio computations, 0210 nano-technology, Material properties, Line (formation), Electronic properties
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b65d5391529006a92da7011880c3df6
https://doi.org/10.1109/iitc.2018.8456484
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