المؤلفون: Chika Tanaka, Kanna Adachi, Motohiko Fujimatsu, Akira Hokazono, Yoshiyuki Kondo, Shigeru Kawanaka

المصدر: IEEE Journal of the Electron Devices Society, Vol 4, Iss 5, Pp 273-277 (2016)

مصطلحات موضوعية: SPICE, semiconductor device modeling, field effect transistors, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/7447668/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/3775700ff536478a93806709a964c166

المؤلفون: Tatsumura, Kosuke, Goto, Masakazu, Shigeru Kawanaka, Atsuhiro Kinoshita

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Kosuke Tatsumura, Takamitsu Ishihara, Seiji Inumiya, Kazuaki Nakajima, Akio Kaneko, Masakazu Goto, Shigeru Kawanaka, Atsuhiro Kinoshita

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Takeshi Sonehara, Akira Hokazono, Haruko Akutsu, Tomokazu Sasaki, Hiroshi Uchida, Mitsuhiro Tomita, Hideji Tsujii, Shigeru Kawanaka, Satoshi Inaba, Yoshiaki Toyoshima

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Motohiko Fujimatsu, Akira Hokazono, Shigeru Kawanaka, K. Adachi, Yoshiyuki Kondo, Chika Tanaka

المصدر: IEEE Journal of the Electron Devices Society, Vol 4, Iss 5, Pp 273-277 (2016)

مصطلحات موضوعية: Engineering, Spice, Semiconductor device modeling, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Electronic circuit simulation, Computer Science::Hardware Architecture, Computer Science::Emerging Technologies, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, field effect transistors, Electrical and Electronic Engineering, Quantum tunnelling, SPICE, 010302 applied physics, business.industry, Electrical engineering, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, 021001 nanoscience & nanotechnology, Electronic, Optical and Magnetic Materials, Logic gate, lcsh:Electrical engineering. Electronics. Nuclear engineering, 0210 nano-technology, business, lcsh:TK1-9971, semiconductor device modeling, Hardware_LOGICDESIGN, Biotechnology, Voltage, Network analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f1de34158e83f408f7efbcb915b0276
https://doi.org/10.1109/jeds.2016.2550606

المؤلفون: Masato Koyama, T. Uechi, Masakazu Goto, Hiroyoshi Tanimoto, Shigeru Kawanaka, J. Shimokawa, Tetsufumi Tanamoto, K. Kukita, Y. Yokota, Shinichi Takagi

المصدر: Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, Planar, business.industry, Subthreshold swing, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::73d4b2b3e162e62b2571ab39c1de0dfd
https://doi.org/10.7567/ssdm.2017.ps-3-14

المؤلفون: R. Benbalagh, Akira Hokazono, I. Martin, B. Sallé, Takeshi Sonehara, Shiro Takeno, Mitsuhiro Tomita, L Renaud, T. Kinno, Haruko Akutsu, Shigeru Kawanaka

المصدر: Applied Surface Science. 259:726-730

مصطلحات موضوعية: Chemistry, Analytical chemistry, General Physics and Astronomy, Surfaces and Interfaces, General Chemistry, Atom probe, Condensed Matter Physics, Laser, Laser assisted, Rutherford backscattering spectrometry, Surfaces, Coatings and Films, law.invention, Ion, law, Thin film, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b3d4e75a1dd74f8956739e43e6f28652
https://doi.org/10.1016/j.apsusc.2012.07.108

المؤلفون: K. Kagimoto, K. Nagaoka, K. Adachi, M. Kamiyashiki, Y. Ito, Akira Hokazono, Kazunari Ishimaru, A. Hidaka, Masakazu Goto, Toshitaka Miyata, M. Kamimura, S. Hirooka, Shigeru Kawanaka, Yohji Watanabe, Tatsuya Ohguro, H. Tanaka

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Materials science, Gate oxide, business.industry, Amplifier, Transconductance, RF power amplifier, MOSFET, Electrical engineering, Breakdown voltage, Cascode, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6eda87870c63bf0550a6566fd6ccb036
https://doi.org/10.1109/iedm.2015.7409769

المؤلفون: Takeshi Sonehara, Akira Hokazono, Hiroshi Uchida, Yoshiaki Toyoshima, Satoshi Inaba, Mitsuhiro Tomita, H. Akutsu, Shigeru Kawanaka, T. Sasaki

المصدر: IEEE Transactions on Electron Devices. 58:3778-3786

مصطلحات موضوعية: Materials science, Dopant, Metallurgy, Contact resistance, Doping, chemistry.chemical_element, Atom probe, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Chemical engineering, chemistry, law, Silicide, Grain boundary, Electrical and Electronic Engineering, Platinum, Sheet resistance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::71a8671212ac8b1d8d5f644ed78526ba
https://doi.org/10.1109/ted.2011.2166557

المؤلفون: Yoshiaki Toyoshima, Ichiro Mizushima, Shigeru Kawanaka, Akira Hokazono, Naoki Kusunoki, Satoshi Inaba, Hiroshi Itokawa

المصدر: IEEE Transactions on Electron Devices. 58:1302-1310

مصطلحات موضوعية: Materials science, Silicon, Dopant, business.industry, Transistor, Doping, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Semiconductor, chemistry, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Hardware_LOGICDESIGN, Random dopant fluctuation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::900b931ec76b64f6b8210bde88e06b76
https://doi.org/10.1109/ted.2011.2112770