المؤلفون: Lee, H., Shin, S.H., Yoo, Y., Kang, S.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(7):2377-2390 Jul, 2023

المؤلفون: Han, J.W., Park, S.H., Jeong, M.Y., Lee, K.S., Kim, K.N., Kim, H.J., Shin, J.C., Park, S.M., Shin, S.H., Park, S.W., Lee, J.H., Kim, S.H., Kim, B.C, Jung, M.H., Yoon, I.Y., Kim, H., Jang, S.U., Park, K.J., Kim, Y.K., Kim, I.G., Oh, J.H, Han, S.Y., Kim, B.S., Kuh, B.J., Park, J.M.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Lee, H., Yoo, Y., Shin, S.H., Kang, S.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(6):781-793 Jun, 2022

المؤلفون: Park, S., Kim, D., Cho, Y., Shim, J., Shin, C., Shin, S.H.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(6):858-861 Jun, 2022

المؤلفون: Alam, M.A., Mahajan, B.K., Chen, Y., Ahn, W., Jiang, H., Shin, S.H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(11):4556-4565 Nov, 2019

المؤلفون: Bae, S., Choi, J., Kim, C., Shin, S.H., Park, H., Kang, Y., Lee, H., Kim, D.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 9(3):615-620 May, 2019

المؤلفون: Lee, J.W., Kim, Y.S., Kim, J.Y., Park, Y.K., Shin, S.H., Lee, S.H., Oh, J.H., Lee, J.G., Lee, J.Y., Bae, D.I., Lee, E.-C., Lee, C.S., Yun, C.J., Cho, C.H., Jin, K.Y., Park, Y.J., Chung, T.Y., Kinam Kim

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :449-452 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

المؤلفون: Lee, B., Jang, K.W., Yoo, W.J., Shin, S.H., Moon, J., Han, K.-T., Jeon, D.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 60(2):932-936 Apr, 2013

المؤلفون: Park, Y.K., Cho, C.H., Lee, K.H., Roh, B.H., Ahn, Y.S., Lee, S.H., Oh, J.H., Lee, J.G., Kwak, D.H., Shin, S.H., Bae, J.S., Kim, S.B., Lee, J.K., Lee, J.Y., Kim, M.S., Lee, J.W., Lee, D.J., Hong, S.H., Bae, D.I., Chun, Y.S., Park, S.H., Yun, C.J., Chung, T.Y., Kinam Kim

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :819-822 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Jeong, H.S., Yang, W.S., Hwang, Y.S., Cho, C.H., Park, S., Ahn, S.J., Chun, Y.S., Shin, S.H., Song, S.H., Lee, J.Y., Jang, S.M., Lee, C.H., Jeong, J.H., Cho, M.H., Lee, J.K., Kinam Kim

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :353-356 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM