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1مؤتمر
المؤلفون: Liu, Wen, Wu, Ernest, Guarin, Fernando, Griffin, Charles, Dufresne, Roger, Badami, Dinesh, Shinosky, Michael, Brochu, David
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2016 IEEE International. :7A-3-1-7A-3-5 Apr, 2016
Relation: 2016 IEEE International Reliability Physics Symposium (IRPS)
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2مؤتمر
المؤلفون: Chen, Fen, Mccullen, Erik, Christiansen, Cathryn, Shinosky, Michael, Dufresne, Roger, Periasamy, Prakash, Kontra, Rick, Graas, Carole, StOnge, Gary
المصدر: 2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :2D.4.1-2D.4.7 Apr, 2015
Relation: 2015 IEEE International Reliability Physics Symposium (IRPS)
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3مؤتمر
المؤلفون: Chen, Fen, Graas, Carole, Shinosky, Michael, Burke, Chad, Feng, Kai D, Bocash, Craig, Muralidhar, Ramachandran
المصدر: 2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :3A.1.1-3A.1.11 Apr, 2015
Relation: 2015 IEEE International Reliability Physics Symposium (IRPS)
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4مؤتمر
المؤلفون: Chen, Fen, Graas, Carole, Shinosky, Michael, Griffin, Chuck, Dufresne, Roger, Bolam, Ronald, Christiansen, Cathryn, Kai Zhao, Narasimha, Shreesh, Tian, Chunyan, Choon-Leong Lou
المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :3A.1.1-3A.1.11 Jun, 2014
Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)
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5مؤتمر
المؤلفون: Chen, Fen, Shinosky, Michael, Aitken, John, Yang, Chih-Chao, Edelstein, Daniel
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :2F.2.1-2F.2.7 Apr, 2013
Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)
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6مؤتمر
المؤلفون: Chen, Fen, Mittl, Steven, Shinosky, Michael, Dufresne, Roger, Aitken, John, Wang, Yanfeng, Kolvenback, Kevin, Henson, William K, Mocuta, Dan
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :PI.1.1-PI.1.5 Apr, 2013
Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)
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7مؤتمر
المؤلفون: Chen, Fen, Gambino, Jeffrey, Shinosky, Michael, Aitken, John, Huang, Elbert, Cohen, Stephan, Yang, Chih-Chao, Edelstein, Dan, Wang, Yun, Kane, Terry, Kioussis, Dimitri
المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :3A.3.1-3A.3.9 Apr, 2012
Relation: 2012 IEEE International Reliability Physics Symposium (IRPS)
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8مؤتمر
المؤلفون: Chen, Fen, Mittl, Steve, Shinosky, Michael, Swift, Ann, Kontra, Rick, Anderson, Brent, Aitken, John, Wang, Yanfeng, Kinser, Emily, Kumar, Mahender, Wang, Yun, Kane, Terence, Feng, Kai D., Henson, William K, Mocuta, Dan, Li, Di-an
المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :6A.4.1-6A.4.9 Apr, 2012
Relation: 2012 IEEE International Reliability Physics Symposium (IRPS)
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9دورية أكاديمية
المؤلفون: Chen, F., Graas, Carole, Shinosky, Michael, Zhao, Kai, Narasimha, Shreesh, Liu, Xiao Hu, Tian, Chunyan
المصدر: In Microelectronics Reliability December 2015 55(12) Part B:2727-2747
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10دورية أكاديمية
المؤلفون: Shinosky, Michael, Fen Chena
المصدر: Journal of Applied Physics; Sep2010, Vol. 108 Issue 5, p054107-41077, 7p, 2 Black and White Photographs, 12 Graphs
مصطلحات موضوعية: VERY large scale circuit integration, DIELECTRICS, HEAT conduction, COPPER, METALS