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المؤلفون: Parnashri Wankhede, Devansh Singh, Manish Kumar Sahu, Aruna Veluru, Monisa Ramesh Babu, Chenlong Miao, Shenghua Song, Shobhit Malik, Sriram Madhavan
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fc7fcc03896adebf99f30711acf38bfb
https://doi.org/10.1117/12.2614185 -
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المؤلفون: Shenghua Song, Eric Chiu, Panneerselvam Venkatachalam, CT Lim, Chenlong Miao, Sriram Madhavan, William Wilkinson, Haizhou Yin, Shobhit Malik, Monisa Ramesh Babu, Peter Lin, Michael Wojtowecz, Deborah Ryan
المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Design rule checking, Computer science, business.industry, Semiconductor device fabrication, Integrated circuit, Design for manufacturability, law.invention, Reliability engineering, Workflow, Product lifecycle, Analytics, law, Node (circuits), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f451d018163ccbc244df6bb8763d8207
https://doi.org/10.1109/asmc51741.2021.9435661 -
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المؤلفون: Philippe Hurat, Ya-Chieh Lai, Atul Chittora, Jeffrey E. Nelson, Xiaoyuan Qi, Rwik Sengupta, Binod Kumar G. Nair, Aaron Sinnott, Frank E. Gennari, Jac Condella, Jonathan Fales, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Adaptive sampling, Computer science, law, Yield (finance), Transistor, Process (computing), Normalization (sociology), Critical area, Projection (set theory), Failure mode and effects analysis, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e31d2dd7cd19fd6f640897511ffa93f0
https://doi.org/10.1117/12.2583515 -
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المؤلفون: Neerja Bawaskar, Fadi Batarseh, Davide Pacifico, Atul Chittora, Shenghua Song, Monisa Ramesh Babu, Shobhit Malik, Janam Bakshi
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Computer science, business.industry, Pattern analysis, Pattern recognition, Artificial intelligence, business, Fault detection and isolation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1eb74727b7dd90ec74ef311d74d9c631
https://doi.org/10.31399/asm.cp.istfa2020p0352 -
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المؤلفون: Joo Hyun Park, Deborah Ryan, Haizhou Yin, Pouya Rezaeifakhr, Shobhit Malik, Eric Chiu, Panneerselvam Venkatachalam, Kiruthika Murali, Praneetha Poluju, Shenghua Song, Sriram Madhavan, Monisa Ramesh Babu, Qian Xie
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Computer science, business.industry, Big data, computer.software_genre, Field (computer science), Outlier, Data analysis, Feature (machine learning), Anomaly detection, Data mining, Layer (object-oriented design), Cluster analysis, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::79f9de1e6db1263bdcc99d042c7302e5
https://doi.org/10.1117/12.2551939 -
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المؤلفون: Zhao Chuan Lee, Vikas Tripathi, Yongfu Li, I-Lun Tseng, Valerio Perez, Jonathan Yoong Seang Ong, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIII.
مصطلحات موضوعية: Data set, Artificial neural network, Computer science, Supervised learning, Hardware_INTEGRATEDCIRCUITS, Context (language use), Data mining, Pattern matching, computer.software_genre, Work related, computer, Lithography, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::78358f8b07152e7ada9d8baaf83a7b0e
https://doi.org/10.1117/12.2513655 -
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المؤلفون: Ramya Srinivasan, Haritez Narisetty, Sriram Madhavan, Ahmed Mohyeldin, Uwe Paul Schroeder, Shobhit Malik
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Computer science, 0211 other engineering and technologies, Static timing analysis, 02 engineering and technology, Integrated circuit, 020202 computer hardware & architecture, Design for manufacturability, law.invention, Robustness (computer science), law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Redundancy (engineering), Electronic engineering, Multiple patterning, Parasitic extraction, 021106 design practice & management
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f3861ef85bf38db8014897a8684e07f
https://doi.org/10.1117/12.2261588 -
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المؤلفون: Shobhit Malik, C. Schuermyer, Thomas Herrmann, Rao Desineni, Geir Eide, Sriram Madhavan
المصدر: IEEE Design & Test. 30:26-34
مصطلحات موضوعية: Identification (information), Hardware and Architecture, Feature (computer vision), business.industry, Computer science, Real-time computing, Pattern recognition, Artificial intelligence, Electrical and Electronic Engineering, business, Software, Software quality, Volume (compression)
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المؤلفون: Sriram Madhavan, Shobhit Malik, Thomas Herrmann
المصدر: ETS
مصطلحات موضوعية: Engineering, Event (computing), business.industry, Yield (finance), Time to market, Hardware_INTEGRATEDCIRCUITS, Node (circuits), Sensitivity (control systems), Duration (project management), Chip, business, Reliability engineering, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::49f0b0901c32201ae69a4d92961a1cc4
https://doi.org/10.1109/ets.2014.6847815 -
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المؤلفون: Yan Pan, Kannan Sekar, Atul Chittora, Shobhit Malik, Lim Seng Keat
المصدر: 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).
مصطلحات موضوعية: Engineering, Design data, business.industry, Yield (finance), Perspective (graphical), Volume (computing), sort, Failure rate, business, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e1d7dd86809732c983fd3cd8188bfe3
https://doi.org/10.1109/asmc.2014.6846948