يعرض 1 - 10 نتائج من 18 نتيجة بحث عن '"Shroff, Mehul D."', وقت الاستعلام: 1.03s تنقيح النتائج
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    مؤتمر

    المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-9 Jul, 2023

    Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  2. 2
    مؤتمر

    المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-7 Jul, 2022

    Relation: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  3. 3
    مؤتمر

    المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-10 Sep, 2021

    Relation: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  4. 4
    مؤتمر

    المصدر: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2018 IEEE International Conference on. :43-47 Mar, 2018

    Relation: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

  5. 5
    مؤتمر

    المصدر: 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Computer-Aided Design (ICCAD), 2016 IEEE/ACM International Conference on. :1-7 Nov, 2016

    Relation: 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

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    دورية أكاديمية
  9. 9
    دورية أكاديمية
  10. 10
    مؤتمر

    المصدر: Proceedings of SPIE; 11/7/2020, Vol. 11614, p1161403-1161403, 1p