يعرض 1 - 10 نتائج من 48 نتيجة بحث عن '"Shu Yi Yu"', وقت الاستعلام: 0.98s تنقيح النتائج
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    مؤتمر

    المؤلفون: Shu-Yi Yu, McCluskey, E.J.

    المصدر: Proceedings International Test Conference 2001 (Cat. No.01CH37260) International test conference Test Conference, 2001. Proceedings. International. :240-249 2001

    Relation: Proceedings International Test Conference

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    مؤتمر

    المؤلفون: Shu-Yi Yu, McCluskey, E.J.

    المصدر: Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on. :125-133 2001

    Relation: Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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    دورية أكاديمية

    المصدر: IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 17(1):29-41 Jan, 2000

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