المؤلفون: Luo, L., Shubhakar, K., Mei, S., Raghavan, N., Zhang, F., Shum, D., Pey, K. L.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Shukla, N, Somwar, R, Smith, RS, Ambati, S, Munoz, S, Merchant, M, D'Arcy, P, Wang, X, Kobos, R, Antczak, C, Bhinder, B, Shum, D, Radu, C, Yang, GB, Taylor, BS, Ng, CKY, Weigelt, B, Khodos, I, de Stanchina, E, Reis, JS, Ouerfelli, O, Linder, S, Djaballah, H, Ladanyi, M

المصدر: Cancer research. 76(15):4525-4534

مصطلحات موضوعية: Medicin och hälsovetenskap

URL الوصول: http://kipublications.ki.se/Default.aspx?queryparsed=id:134106115

المؤلفون: Shum, D., Luo, L.Q., Kong, Y.J., Deng, F.X., Qu, X., Teo, Z.Q., Liu, J.Q., Zhang, F., Cai, X.S., Tan, K.M., Lim, K.Y., Khoo, P., Yeo, P.Y., Nguyen, B.Y., Jung, S.M., Siah, S.Y., Pey, K.L., Shubhakar, K., Wang, C.M., Xing, J.C., Liu, G.Y., Diao, Y., Lin, G.M., Luo, F., Tee, L., Markov, V., Lemke, S.M., Ghazavi, P., Do, N., Tiwari, V., Liu, X.

المصدر: 2017 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2017 IEEE International. :1-4 May, 2017

Relation: 2017 IEEE International Memory Workshop (IMW)

المؤلفون: Luo, L. Q., Teo, Z. Q., Kong, Y. J., Deng, F. X., Liu, J. Q., Zhang, F., Cai, X. S., Tan, K. M., Lim, K. Y., Khoo, P., Jung, S. M., Siah, S. Y., Shum, D., Wang, C. M., Xing, J. C., Liu, G. Y., Diao, Y., Lin, G. M., Tee, L., Lemke, S. M., Ghazavi, P., Liu, X., Do, N., Pey, K. L., Shubhakar, K.

المصدر: 2016 IEEE 8th International Memory Workshop (IMW) Memory Workshop (IMW), 2016 IEEE 8th International. :1-4 May, 2016

Relation: 2016 IEEE International Memory Workshop (IMW)

المؤلفون: Luo, L. Q., Wang, D. X., Zhang, F., Tan, J. B., Chow, Y. T., Kong, Y. J., Huang, J. Y., Liu, Y. M., Oh, M., Balan, H., Khoo, P., Chen, C. Q., Liu, B. H., Shum, D., Shubhakar, K., Pey, K. L.

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :115-118 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Tadjpour, S., Rossi, P., Romano, L., Chokkalingam, R., Firouzkouhi, H., Shi, F., Leroux, M., Gerna, D., Venca, A., Vasa, J., Ramachandran, B., Brunn, B., Pirola, A., Ottini, D., Milani, A., Sacchi, E., Behera, M., Chen, X., Decanis, U., Tedeschi, M., DalToso, S., Eyssa, W., Cakir, C., Prakash, C., He, Y., Damavandi, N., Srinivasan, R., Shum, D., Fan, X., Yu, C., Pehlivanoglu, E., Zarei, H., Loke, A., Uehara, G., Castello, R., Song, Y.

المصدر: ESSCIRC 2014 - 40th European Solid State Circuits Conference (ESSCIRC) European Solid State Circuits Conference (ESSCIRC), ESSCIRC 2014 - 40th. :383-386 Sep, 2014

Relation: ESSCIRC 2014 - 40th European Solid State Circuits Conference

المؤلفون: Lee, K., Yamane, K., Noh, S., Naik, V. B., Yang, H., Jang, S. H., Kwon, J., Behin-Aein, B., Chao, R., Lim, J. H., S. K., Gan, K. W., Zeng, D., Thiyagarajah, N., Goh, L. C., Liu, B., Toh, E. H., Jung, B., Wee, T. L., Ling, T., Chan, T. H., Chung, N. L., Ting, J. W., Lakshmipathi, S., Son, J. S., Hwang, J., Zhang, L., Low, R., Krishnan, R., Kitamura, T., You, Y. S., Seet, C. S., Cong, H., Shum, D., Wong, J., Woo, S. T., Lam, J., Quek, E., See, A., Siah, S. Y.

المصدر: 2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :183-184 Jun, 2018

Relation: 2018 IEEE Symposium on VLSI Technology

المؤلفون: Shum, D., Power, J. R., Ullmann, R., Suryaputra, E., Ho, K., Hsiao, J., Tan, C. H., Langheinrich, W., Bukethal, C., Pissors, V., Tempel, G., Rohrich, M., Gratz, A., Iserhagen, A., Andersen, E. O., Paprotta, S., Dickenscheid, W., Strenz, R., Duschl, R., Kern, T., Hsieh, C. T., Huang, C. M., Ho, C. W., Kuo, H. H., Hung, C. W., Lin, Y. T., Tran, L. C.

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)

المؤلفون: Shum, D., Houssameddine, D., Woo, S. T., You, Y. S., Wong, J., Wong, K. W., Wang, C. C., Lee, K. H., Yamane, K., Naik, V. B., Seet, C. S., Tahmasebi, T., Hai, C., Yang, H. W., Thiyagarajah, N., Chao, R., Ting, J. W., Chung, N. L., Ling, T., Chan, T. H., Siah, S. Y., Nair, R., Deshpande, S., Whig, R., Nagel, K., Aggarwal, S., DeHerrera, M., Janesky, J., Lin, M., Chia, H.-J., Hossain, M., Lu, H., Ikegawa, S., Mancoff, F. B., Shimon, G., Slaughter, J. M., Sun, J. J., Tran, M., Alam, S. M., Andre, T.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T208-T209 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Agarwal, S., Dixit, H., Datta, D., Tran, M., Houssameddine, D., Shum, D., Benistant, F.

المصدر: 2018 IEEE International Magnetics Conference (INTERMAG) Magnetics Conference (INTERMAG), 2018 IEEE International. :1-1 Apr, 2018

Relation: 2018 IEEE International Magnetics Conference (INTERMAG)