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1دورية أكاديمية
المؤلفون: Chih-Yao Chang, Yao-Luen Shen, Ching-Yao Wang, Shun-Wei Tang, Tian-Li Wu, Wei-Hung Kuo, Suh-Fang Lin, Chih-Fang Huang
المصدر: IEEE Journal of the Electron Devices Society, Vol 9, Pp 687-690 (2021)
مصطلحات موضوعية: GaN, high electron mobility transistor (HEMT), indium–tin–oxide gate electrode, PBTI, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Tian-Li Wu, Shun-Wei Tang, Hong-Jia Jiang
المصدر: Micromachines, Vol 11, Iss 2, p 163 (2020)
مصطلحات موضوعية: gan, metal-insulator-semiconductor high-electron-mobility transistor (mis-hemt), recessed gate, double barrier, Mechanical engineering and machinery, TJ1-1570
وصف الملف: electronic resource
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3
المؤلفون: Shun-Wei Tang, Benoit Bakeroot, Zhen-Hong Huang, Szu-Chia Chen, Wei-Syuan Lin, Ting-Chun Lo, Matteo Borga, Dirk Wellekens, Niels Posthuma, Stefaan Decoutere, Tian-Li Wu
المصدر: IEEE Transactions on Electron Devices. 70:449-453
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4
المؤلفون: Shun-Wei Tang, Zhen-Hong Huang, Szu-Chia Chen, Wei-Syuan Lin, Brice de Jaeger, Dirk Wellekens, Matteo Borga, Benoit Bakeroot, Stefaan Decoutere, Tian-Li Wu
المصدر: IEEE Electron Device Letters. 43:1625-1628
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5
المؤلفون: Shun-Wei Tang, Wei-Syuan Lin, Zhen-Hong Huang, Tian-Li Wu
المصدر: IEEE Electron Device Letters. 43:1617-1620
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6
المؤلفون: Zhen-Hong Huang, Shun-Wei Tang, Chao-Ta Fan, Ming-Cheng Lin, Tian-Li Wu
المصدر: Microelectronics Reliability. 145:114983
مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials
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7
المؤلفون: Shun-Wei Tang, Chao-Ta Fan, Ming-Cheng Lin, Tian-Li Wu
المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::423b28d6c1591f99a85fa2fc9e2f0e32
https://doi.org/10.1109/ipfa55383.2022.9915772 -
8
المؤلفون: Ming-Cheng Lin, Chao-Ta Fan, Shun-Wei Tang, Tian-Li Wu, Chih-Fang Huang
المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e95949b4932289bcce3f8706b12b3b4d
https://doi.org/10.1109/ispsd49238.2022.9813533 -
9
المؤلفون: Shun-Wei Tang, Yao-Luen Shen, Tian-Li Wu, Suh-Fang Lin, Chih-Yao Chang, Wei-Hung Kuo, Ching-Yao Wang, Chih-Fang Huang
المصدر: IEEE Journal of the Electron Devices Society. 9:687-690
مصطلحات موضوعية: Materials science, Condensed matter physics, Logic gate, Electrode, Breakdown voltage, Trapping, Electrical and Electronic Engineering, Instability, Ohmic contact, Layer (electronics), Electronic, Optical and Magnetic Materials, Biotechnology, Indium tin oxide
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10
المؤلفون: Brice De Jaeger, Thanh Nga Tran, Sachidananda Dash, Jethro Oroceo Gallardo, Tian-Li Wu, Dirk Wellekens, Shun-Wei Tang, Benoit Bakeroot, Stefaan Decoutere
المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Materials science, business.industry, Mode (statistics), Optoelectronics, Schottky diode, business, Stability (probability), Power (physics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d0cd0a990ccbe528b04a5acb18f1564
https://doi.org/10.1109/ipfa53173.2021.9617330