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المؤلفون: Michael S Chan, Marinus Hopstaken, Kisup Chung, Zhebo Chen, Miaomiao Wang, Steven Hung, Ruqiang Bao, Barman Soumendra Narayan, Yang Yixiong, Xin Miao, Sanjay Natarajan, Richard A. Conti, Hemanth Jagannathan, Lin Yongjing, Tang Wei, Li Luping, Bala S. Haran, Siddarth A. Krishnan, Michael Chudzik, Dalea McHerron
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, Gate resistance, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Engineering physics, Dipole, CMOS, 0103 physical sciences, Thermal, Hardware_INTEGRATEDCIRCUITS, Work function, 0210 nano-technology, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4977144b733227eec099124ed6d44a7e
https://doi.org/10.1109/iedm.2018.8614524 -
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المؤلفون: Felipe Tijiwa-Birk, Brian A. Cohen, Shishir Ray, K. K. Kohli, Siddarth A. Krishnan, Joyeeta Nag, C. Parks, Andrew H. Simon
المصدر: IEEE Transactions on Semiconductor Manufacturing. 28:469-473
مصطلحات موضوعية: Kelvin probe force microscope, Materials science, business.industry, Annealing (metallurgy), Metallurgy, Alloy, Copper interconnect, chemistry.chemical_element, Dielectric, engineering.material, Condensed Matter Physics, Copper, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Back end of line, chemistry, engineering, Optoelectronics, Wafer, Electrical and Electronic Engineering, business
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المؤلفون: Samuel Choi, Minseok Oh, Yan Yan, Anita Madan, Brian A. Cohen, Siddarth A. Krishnan, Andrew H. Simon, Joyeeta Nag, Atsushi Ogino, Baozhen Li, Cathryn Christiansen, Patrick W. DeHaven, Andrew Kim, Jim Shih-Chun Liang
المصدر: ECS Transactions. 69:161-169
مصطلحات موضوعية: Materials science, business.industry, Node (networking), Contact resistance, Electrical engineering, Artificial intelligence, business
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المصدر: Micro-and Nanoelectronics
مصطلحات موضوعية: Planar, Computer science, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7274d8941d7abba5c2762f3397a64dd4
https://doi.org/10.1201/b17597-7 -
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المؤلفون: Shahab Siddiqui, Min Dai, Joseph F. Shepard, Michael P. Chudzik, Siddarth A. Krishnan, Unoh Kwon
المصدر: ECS Transactions. 60:513-518
مصطلحات موضوعية: Atomic layer deposition, Materials science, business.industry, Optoelectronics, Nanotechnology, business, Cmos process, High-κ dielectric, Communication channel
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المؤلفون: Weihao Weng, Stephan Grunow, Richard A. Wachnik, Xin Miao, Siddarth A. Krishnan, Ruqiang Bao, Xiuling Li, Keith Kwong Hon Wong, Vijay Narayanan, Werner A. Rausch, Unoh Kwon
المصدر: IEEE Electron Device Letters. 36:384-386
مصطلحات موضوعية: Materials science, business.industry, Scattering, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, RC time constant, Electronic, Optical and Magnetic Materials, Back end of line, CMOS, Logic gate, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Grain boundary, Electrical and Electronic Engineering, Metal gate, business, Hardware_LOGICDESIGN, Electronic circuit
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المؤلفون: Siddarth A. Krishnan, Eduard A. Cartier, Barry Linder
المصدر: ECS Transactions. 53:187-192
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Electrical engineering, Gate stack, Dielectric, business, Metal gate, Engineering physics
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المؤلفون: Sudarshan Narayanan, Massimo V. Fischetti, Siddarth A. Krishnan, Michael P. Chudzik, Jiseok Kim
المصدر: Microelectronics Reliability. 52:2907-2913
مصطلحات موضوعية: Condensed matter physics, Chemistry, business.industry, Electrical engineering, Oxide, Silicon on insulator, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Cathode, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Hafnium, law.invention, chemistry.chemical_compound, Distribution function, law, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Current density, Quantum tunnelling, Leakage (electronics)
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المؤلفون: Unoh Kwon, Martin M. Frank, Takashi Ando, Siddarth A. Krishnan, Vijay Narayanan
المصدر: Thin Films on Silicon: Electronic and Photonic Applications
مصطلحات موضوعية: Materials science, Gate oxide, business.industry, MOSFET, Optoelectronics, Dielectric, business, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1422caf17f2537bd277cf7271234e6fd
https://doi.org/10.1142/9789814740487_0007 -
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المؤلفون: Richard G. Southwick, Mohit Bajaj, Eduard A. Cartier, A. Dasgupta, Takashi Ando, Oleg Gluschenkov, Unoh Kwon, Vijay Narayanan, Jinping Liu, Marinus Hopstaken, W.L. Chang, Siddarth A. Krishnan, Shishir Ray, Miaomiao Wang, James H. Stathis, Rajan K. Pandey, Tenko Yamashita, Barry P. Linder
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Materials science, Negative-bias temperature instability, Dopant, business.industry, Gate dielectric, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Engineering physics, CMOS, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0210 nano-technology, business, Metal gate, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::05871b2009b497e6ca207ca85519472c
https://doi.org/10.1109/irps.2016.7574532