المؤلفون: Kumari, A., Zaman, M., Kumar, A., Singh, V. R.^{Aff1, IDs11665023078768_cor4}, Ghosh, A., Sahoo, S. K., Rahaman, A., Mandal, Satish K.^{Aff4, Aff5}, Bhunia, Satyaban^{Aff4, Aff5}

المصدر: Journal of Materials Engineering and Performance. 32(22):10391-10401

المؤلفون: Verma, V. K., Sakamoto, S., Ishikawa, K., Singh, V. R., Ishigami, K., Shibata, G., Kadono, T., Koide, T., Kuroda, S., Fujimori, A.

مصطلحات موضوعية: Condensed Matter - Strongly Correlated Electrons

URL الوصول: http://arxiv.org/abs/2204.02042

المؤلفون: Zzaman, M.^{Aff1, Aff2}, Dawn, R., Franklin, J. B., Kumari, A., Ghosh, A., Sahoo, S. K., Verma, V. K., Shahid, R.^{Aff2, IDs11664023103590_cor8}, Goutam, U. K., Kumar, K., Meena, R., Kandasami, A., Singh, V. R.^{Aff1, IDs11664023103590_cor13}

المصدر: Journal of Electronic Materials. 52(6):3818-3830

المؤلفون: Jena, S., Urkude, R., Choi, W.-Y., Pandey, K. K., Karwal, S., Jung, M. H., Gardner, J., Ghosh, B., Singh, V. R.

المصدر: Journal of Applied Physics; 4/28/2024, Vol. 135 Issue 16, p1-10, 10p

مصطلحات موضوعية: EXTENDED X-ray absorption fine structure, THIN films, SPHEROMAKS, PHOTOEMISSION, ELECTRONIC structure, PHOTOELECTRON spectroscopy, SAPPHIRES, X-ray spectroscopy

المؤلفون: Kumar, A., Baral, M., Kandasami, A., Mandal, S. K., Urkude, R., Bhunia, S., Singh, V. R.

المصدر: Journal of Applied Physics; 4/21/2024, Vol. 135 Issue 15, p1-10, 10p

مصطلحات موضوعية: SINGLE crystals, X-ray diffraction, PHOTOELECTRON spectroscopy, SYNCHROTRONS, ELECTRONIC band structure, ELECTRONIC structure, PHOTOEMISSION, X-ray spectroscopy

المؤلفون: Kumari, M., Singh, V. R., Ranjan, R.

المصدر: 2018 International Conference on Computing, Power and Communication Technologies (GUCON) Computing, Power and Communication Technologies (GUCON), 2018 International Conference on. :647-651 Sep, 2018

Relation: 2018 International Conference on Computing, Power and Communication Technologies (GUCON)

المؤلفون: Singh, Gurdiyal^{Aff1, IDs00500022074581_cor1}, Singh, V. R.

المصدر: Soft Computing: A Fusion of Foundations, Methodologies and Applications. 27(6):2993-3005

المؤلفون: Singh, N. K., Kumar, A., Dawn, R., Jena, S., Kumari, A., Singh, V. R.^{Aff1, IDs11664022100377_cor6}, Zzaman, M.^{Aff1, Aff2}, Shahid, R., Panda, D.^{Aff3, Aff4}, Sahoo, S. K., Goutam, U. K., Verma, V. K., Kumar, K., Khatravath, M., Priyam, A.

المصدر: Journal of Electronic Materials. 52(1):669-678

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