المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Smith, Stewart, Terry, Jonathan, Mita, Yoshio, Lewis, Joseph, Li, Yifan

المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Terry, Jonathan G., Smith, Stewart, Mita, Yoshio, Li, Yifan

المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-4 Mar, 2023

Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Zhang, Minxing, Zhang, Shan, Dunare, Camelia, Marland, Jamie R. K., Terry, Jonathan G, Smith, Stewart

المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-5 Mar, 2023

Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Dunare, Camelia, Zhang, Shan, Marland, Jamie R. K., Tsiamis, Andreas, Sullivan, Paul, Underwood, Ian, Terry, Jonathan G., Walton, Anthony J., Smith, Stewart

المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022

Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Ross, Alan W.S., Dover, Coinneach M., Smith, Stewart, Terry, Jonathan G., Mount, Andrew R., Walton, Anthony J.

المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-4 Mar, 2022

Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Schmueser, Ilka, Mackay, C. Logan, Moore, Fiona, Doherty, Kayleigh, Elliott, Justin P., Mount, Andrew R., Walton, Anthony J., Smith, Stewart, Terry, Jonathan G.

المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-5 May, 2020

Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Smith, Stewart

المصدر: OpenAIRE.

Relation: http://books.openedition.org/pufc/basictei/9183; http://books.openedition.org/pufc/tei/9183

URL الوصول: http://books.openedition.org/pufc/9183

المؤلفون: Wang, Cong, Xu, Ben Bin, Terry, Jonathan G., Smith, Stewart, Walton, Anthony J., Li, Yifan

المصدر: 2018 International Flexible Electronics Technology Conference (IFETC) Flexible Electronics Technology Conference (IFETC), 2018 International. :1-3 Aug, 2018

Relation: 2018 International Flexible Electronics Technology Conference (IFETC)

المؤلفون: Sutherland, Andrew (ORCID 0000-0002-3332-3864), Smith, Stewart

المصدر: Music Education Research. 2022 24(5):564-573.

Peer Reviewed: Y

Page Count: 10

Descriptors: Music Education, Musical Instruments, Creative Activities, Teaching Methods, Student Attitudes, Undergraduate Students, Group Instruction, Foreign Countries, Workshops

مصطلحات جغرافية: Australia, Hong Kong

المؤلفون: Buchoux, Anthony, Blair, Ewen O., Tsiamis, Andreas, Marland, Jamie R. K., Smith, Stewart

المصدر: 2017 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2017 Symposium on. :1-6 May, 2017

Relation: 2017 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)