المؤلفون: Kim, Jongwook, So, Sunbeom, Oh, Hakjoo

المصدر: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) ICSE Software Engineering (ICSE), 2023 IEEE/ACM 45th International Conference on. :2224-2236 May, 2023

Relation: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)

المؤلفون: Ha, Seokhyeon, Jung, Sunbeom, Lee, Jungwoo

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2308.07728

المؤلفون: So, Sunbeom, Lee, Myungho, Park, Jisu, Lee, Heejo, Oh, Hakjoo

المصدر: 2020 IEEE Symposium on Security and Privacy (SP) Security and Privacy (SP), 2020 IEEE Symposium on. :1678-1694 May, 2020

Relation: 2020 IEEE Symposium on Security and Privacy (SP)

المؤلفون: Kim, Younsik, Oh, Dongjin, Huh, Soonsang, Song, Dongjoon, Jeong, Sunbeom, Kwon, Junyoung, Kim, Minsoo, Kim, Donghan, Ryu, Hanyoung, Jung, Jongkeun, Kyung, Wonshik, Sohn, Byungmin, Lee, Suyoung, Hyun, Jounghoon, Lee, Yeonghoon, Kim, Yeongkwan Kimand Changyoung

المصدر: Review of Scientific Instruments 92, 073901 (2021)

مصطلحات موضوعية: Computer Science - Machine Learning, Physics - Data Analysis, Statistics and Probability

URL الوصول: http://arxiv.org/abs/2107.00844

المؤلفون: So, Sunbeom, Lee, Myungho, Park, Jisu, Lee, Heejo, Oh, Hakjoo

مصطلحات موضوعية: Computer Science - Programming Languages, Computer Science - Cryptography and Security

URL الوصول: http://arxiv.org/abs/1908.11227

المؤلفون: So, Sunbeom, Oh, Hakjoo

مصطلحات موضوعية: Computer Science - Programming Languages, Computer Science - Artificial Intelligence

URL الوصول: http://arxiv.org/abs/1702.06334

المؤلفون: Jongwook Kim, Sunbeom So, Hakjoo Oh

مصطلحات موضوعية: Software Testing, SMT Solver

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5c2e80b8d8af7297017259f16862dfa0

المؤلفون: Youngwoo Jeong, Seung eun Lee, Sunbeom Kwon, Park Joungmin

المصدر: Micromachines
Volume 14
Issue 2
Pages: 252

مصطلحات موضوعية: true wireless stereo (TWS), noise reduction, embedded system, photoplethysmography (PPG), waveform adjustment (WA), distance estimation, Control and Systems Engineering, Mechanical Engineering, Electrical and Electronic Engineering

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::255a8c42f2f1b907dd42fa1fe6181cc3

المؤلفون: Younsik Kim, Dongjin Oh, Soonsang Huh, Dongjoon Song, Sunbeom Jeong, Junyoung Kwon, Minsoo Kim, Donghan Kim, Hanyoung Ryu, Jongkeun Jung, Wonshik Kyung, Byungmin Sohn, Suyoung Lee, Jounghoon Hyun, Yeonghoon Lee, Yeongkwan Kim, Changyoung Kim

المصدر: The Review of scientific instruments. 92(7)

مصطلحات موضوعية: FOS: Computer and information sciences, Computer Science - Machine Learning, Artificial neural network, Computer science, Statistical noise, business.industry, Noise reduction, Deep learning, FOS: Physical sciences, Pattern recognition, Overfitting, Machine Learning (cs.LG), Constraint (information theory), Noise, Data acquisition, Physics - Data Analysis, Statistics and Probability, Artificial intelligence, business, Instrumentation, Data Analysis, Statistics and Probability (physics.data-an)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6026f98471b2ef7e96765e4fb85bad5b
https://pubmed.ncbi.nlm.nih.gov/34340442

المؤلفون: Dowon Song, Junho Lee, Hakjoo Oh, Sunbeom So

المصدر: Proceedings of the ACM on Programming Languages. 2:1-30

مصطلحات موضوعية: Functional programming, Programming language, Computer science, media_common.quotation_subject, 020207 software engineering, 02 engineering and technology, Space (commercial competition), Symbolic execution, computer.software_genre, Popularity, Reduction (complexity), 020204 information systems, 0202 electrical engineering, electronic engineering, information engineering, Quality (business), Pruning (decision trees), Safety, Risk, Reliability and Quality, computer, Software, Program synthesis, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1010fba7e62da3fac66444c0ab43ecee
https://doi.org/10.1145/3276528