المؤلفون: Polito A., Algieri G., Bonadies S., Calonico A.M., Corrado M., Ferraro A., Gravina A., Iannoccaro G., Morrone C., Quartarolo M.K., Russo T., Soda E., Veltri R., Vivone C., Adilardi A.

المصدر: Rivista di Psicologia dell'Emergenza e dell'Assistenza Umanitaria, Iss 28, Pp 32-80 (2023)

مصطلحات موضوعية: psychosocial planning, Therapeutics. Psychotherapy, RC475-489

وصف الملف: electronic resource

Relation: http://www.psicologiperipopoli.it/files/32-80AAVV.pdf; https://doaj.org/toc/2280-9120

URL الوصول: https://doaj.org/article/edd3a523f9704c54a1572add4021a587

المؤلفون: Abayateye, J., Sanou, H., Adeyemo, B., Pasquini, S., Stori, M., Soda, E., Lamquet, O.

المصدر: 2017 IEEE PES PowerAfrica PowerAfrica, 2017 IEEE PES. :180-185 Jun, 2017

Relation: 2017 IEEE PES/IAS PowerAfrica

المؤلفون: De Nicolao, G., Pozzi, M., Soda, E., Stori, M.

المصدر: 2014 International Conference on Probabilistic Methods Applied to Power Systems (PMAPS) Probabilistic Methods Applied to Power Systems (PMAPS), 2014 International Conference on. :1-6 Jul, 2014

Relation: 2014 International Conference on Probabilistic Methods Applied to Power Systems (PMAPS)

المؤلفون: Inoue, N., Tagami, M., Ito, F., Yamamoto, H., Kawahara, J., Soda, E., Shobha, H., Gates, S., Cohen, S., Liniger, E., Madan, A., Protzman, J., Ryan, E. T., Ryan, V., Ueki, M., Hayashi, Y., Spooner, T.

المصدر: 2012 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2012 IEEE International. :1-3 Jun, 2012

Relation: 2012 IEEE International Interconnect Technology Conference - IITC

المؤلفون: Tagami, M., Shimada, K., Yin, Y., Ishikawa, M., Waskiewicz, C., Chen, S-T., Shobha, H., Soda, E., Saulnier, N., Arnold, J. C., Colburn, M., Usui, T., Spooner, T.

المصدر: 2012 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2012 IEEE International. :1-3 Jun, 2012

Relation: 2012 IEEE International Interconnect Technology Conference - IITC

المؤلفون: Tagami, M., Yang, C-C., Shobha, H., Soda, E., Madan, A., DeHaven, P., Murphy, R., Davis, R., Parks, C., Molis, S., Cohen, S., Ito, F., Spooner, T.

المصدر: 2011 IEEE International Interconnect Technology Conference Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International. :1-3 May, 2011

Relation: Joint 2011 IEEE International Interconnect Technology Conference (IITC) & 2011 Materials for Advanced Metallization (MAM)

المؤلفون: Togo, M., Mogami, T., Kubota, R., Nobusawa, H., Hamada, M., Inoue, K., Mikagi, K., Yoshida, K., Soda, E., Kishi, S., Satou, K., Yamamoto, T., Takeda, K., Aimoto, Y., Nakazawa, Y., Toyoshima, H.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :49-52 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Oda, N., Chikaki, S., Kubota, T., Nakao, S., Tomioka, K., Soda, E., Nakamura, N., Gawase, A., Nogawa, J., Kawashima, Y., Hayashi, R., Suzuki, T., Saito, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(11):2821-2830 Nov, 2010

المؤلفون: Wakabayashi, H., Yamamoto, T., Yoshida, K., Soda, E., Tokunaga, K., Mogami, T., Kunio, T.

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :393-396 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: Kondo, S., Fukaya, K., Ohashi, N., Miyazaki, T., Nagano, H., Wada, Y., Ishibashi, T., Kato, M., Yoneda, K., Soda, E., Nakao, S., Ishigami, K., Kobayashi, N.

المصدر: 2006 International Interconnect Technology Conference Interconnect Technology Conference, 2006 International. :164-166 2006

Relation: 2006 International Interconnect Technology Conference