المؤلفون: Walraven, Jeremy A., Soden, Jerry M., Cole, Edward I., Tanner, Danelle M., Anderson, Richard E.

المصدر: 2001 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.. :236-246 Sep, 2001

Relation: 2001 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

المؤلفون: Soden, Jerry M.^Aff3, Hawkins, Charles F.^Aff4, Gulati, Ravi K.^Aff5, Mao, Weiwei^Aff5

المساهمون: Gulati, Ravi K., editor^Aff1, Hawkins, Charles F., editor^Aff2

المصدر: IDDQ Testing of VLSI Circuits. :5-17

المؤلفون: Soden, Jerry M., Hawkins, Charles F., Gulati, Ravi K., Mao, Weiwei

المصدر: Journal of Electronic Testing: Theory and Applications. December 1992 3(4):291-303

المؤلفون: Mayer, Donald C, Katz, Richard B, Osborn, Jon V, Soden, Jerry M, Barto, R, Day, John H

مصطلحات موضوعية: Spacecraft Design, Testing And Performance

URL الوصول: https://ntrs.nasa.gov/citations/20010067780

المؤلفون: Soden, Jerry M, Hawkins, Charles F

المصدر: New Mexico Univ., The Fifth NASA Symposium on VLSI Design.

مصطلحات موضوعية: Quality Assurance And Reliability

Relation: Twenty-Fourth Lunar and Planetary Science Conference. Part 3: N-Z

URL الوصول: https://ntrs.nasa.gov/citations/19940016620

المؤلفون: Walraven, Jeremy A., Soden, Jerry M., Tanner, Danelle M., Tangyunyong, Paiboon, Cole Jr., Edward I., Anderson, Richard E., Irwin, Lloyd W.

المصدر: Proceedings of SPIE; Nov2000, Issue 1, p30-39, 10p

المؤلفون: Shaneyfelt, Marty R., Tangyunyong, Paiboon, Hill, Thomas A., Soden, Jerry M., Flores, Richard S., Schwank, James R., Dodd, Paul E., Hash, Gerald L.

المصدر: IEEE Transactions on Nuclear Science; Oct2004 Part 3 of 4, Vol. 51 Issue 5, p2782-2786, 5p

مصطلحات موضوعية: INTEGRATED circuits, ELECTRONIC circuits, MICROELECTRONICS, RADIATION, MICROSCOPY, RANDOM access memory, COMPUTER storage devices

المؤلفون: Soden, Jerry M., Hawkins, Charles F., Gulati, Ravi K., Mao, Weiwei

المصدر: Journal of Electronic Testing; December 1992, Vol. 3 Issue: 4 p291-303, 13p

المؤلفون: Soden, Jerry M., Hawkins, Charles F.

المصدر: IEEE Spectrum; Sep 96, Vol. 33 Issue 9, p66, 6p, 4 Diagrams, 1 Chart, 1 Graph

مصطلحات موضوعية: COMPLEMENTARY metal oxide semiconductors

الشركة/الكيان: SEMICONDUCTOR Industry Association (Organization)

المؤلفون: Vallett, David P., Soden, Jerry M.

المصدر: IEEE Spectrum; Oct97, Vol. 34 Issue 10, p39, 12p, 1 Color Photograph, 4 Black and White Photographs, 3 Diagrams, 1 Chart, 1 Graph

مصطلحات موضوعية: INTEGRATED circuit fault tolerance