-
1مؤتمر
المصدر: 2021 IEEE/ACM International Conference on Technical Debt (TechDebt) TECHDEBT Technical Debt (TechDebt), 2021 IEEE/ACM International Conference on. :94-98 May, 2021
Relation: 2021 IEEE/ACM International Conference on Technical Debt (TechDebt)
-
2مؤتمر
المؤلفون: Biesialska, Katarzyna, Franch, Xavier, Muntes-Mulero, Victor
المصدر: 2018 IEEE/ACM 6th International Workshop on Conducting Empirical Studies in Industry (CESI) CESI Conducting Empirical Studies in Industry (CESI), 2018 IEEE/ACM 6th International Workshop on. :29-32 May, 2018
Relation: 2018 IEEE/ACM 6th International Workshop on Conducting Empirical Studies in Industry (CESI)
-
3دورية أكاديمية
المؤلفون: Tao JIANG, Xinyu XU, Yonghai CHU, Taoyong JIN, Wei LIANG, Yihao WU, Yanguang FU, Yongqi ZHAO, Xinwei GUO
المصدر: Journal of Geodesy & Geoinformation Science; Sep2023, Vol. 6 Issue 3, p76-86, 11p
مصطلحات موضوعية: GEODESY, EARTH gravitation, GEOID, COMPUTER software research
مصطلحات جغرافية: CHINA
-
4دورية أكاديمية
المصدر: Avtomobilʹnyj Transport (Harʹkov), Vol 52, Pp 14-24 (2023)
مصطلحات موضوعية: computer simulation, mathematical modeling, spatial model, car, engine, software research, software analysis, Motor vehicles. Aeronautics. Astronautics, TL1-4050
وصف الملف: electronic resource
-
5مؤتمر
المؤلفون: Jarvinen, Janne, Huomo, Tua, Mikkonen, Tommi
المصدر: 2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C) ICSE-C Software Engineering Companion (ICSE-C), 2017 IEEE/ACM 39th International Conference on. :314-316 May, 2017
Relation: 2017 IEEE/ACM 39th International Conference on Software Engineering Companion (ICSE-C)
-
6مؤتمر
المؤلفون: Selic, Bran
المصدر: 2015 IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice Software Engineering Research and Industrial Practice (SER&IP), 2015 IEEE/ACM 2nd International Workshop on. :58-61 May, 2015
Relation: 2015 IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice (SER&IP)
-
7كتاب إلكتروني
المؤلفون: Kim, Jeong AhAff38, Kim, SunTaeAff39, Choi, JaeYoungAff40, Lee, Ji YoungAff40, Cho, Young HwaAff40
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Panigrahi, Bijaya Ketan, Series EditorAff3, Chakraborty, Samarjit, Series EditorAff4, Chen, Jiming, Series EditorAff5, Chen, Shanben, Series EditorAff6, Chen, Tan Kay, Series EditorAff7, Dillmann, Rüdiger, Series EditorAff8, Duan, Haibin, Series EditorAff9, Ferrari, Gianluigi, Series EditorAff10, Ferre, Manuel, Series EditorAff11, Hirche, Sandra, Series EditorAff12, Jabbari, Faryar, Series EditorAff13, Jia, Limin, Series EditorAff14, Kacprzyk, Janusz, Series EditorAff15, Khamis, Alaa, Series EditorAff16, Kroeger, Torsten, Series EditorAff17, Liang, Qilian, Series EditorAff18, Martin, Ferran, Series EditorAff19, Ming, Tan Cher, Series EditorAff20, Minker, Wolfgang, Series EditorAff21, Misra, Pradeep, Series EditorAff22, Möller, Sebastian, Series EditorAff23, Mukhopadhyay, Subhas, Series EditorAff24, Ning, Cun-Zheng, Series EditorAff25, Nishida, Toyoaki, Series EditorAff26, Pascucci, Federica, Series EditorAff27, Qin, Yong, Series EditorAff28, Seng, Gan Woon, Series EditorAff29, Speidel, Joachim, Series EditorAff30, Veiga, Germano, Series EditorAff31, Wu, Haitao, Series EditorAff32, Zhang, Junjie James, Series EditorAff33, Park, James J., editorAff34, Yang, Laurence T., editorAff35, Jeong, Young-Sik, editorAff36, Hao, Fei, editorAff37
المصدر: Advanced Multimedia and Ubiquitous Engineering : MUE/FutureTech 2019. 590:91-97
-
8مؤتمر
المؤلفون: Doglioni, C., Kim, D., Stewart, G.A., Silvestris, L., Jackson, P., Kamleh, W., Bird, Ian, Campana, Simone, Mato Vila, Pere, Roiser, Stefan, Schulz, Markus, Stewart, Graeme A., Valassi, Andrea
المصدر: EPJ Web of Conferences; 11/16/2020, Vol. 245, p1-7, 7p
-
9دورية أكاديمية
المؤلفون: Gao, Xuexin, Mu, Yongmin, Shen, Meie
المصدر: International Journal of Computers & Applications; Nov2020, Vol. 42 Issue 8, p740-747, 8p
-
10دورية أكاديمية
المؤلفون: Kostoglotov, A. A.Aff1, Andrashitov, D. S., Kornev, A. S., Lazarenko, S. V.
المصدر: Measurement Techniques. 62(6):497-502