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1
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2مؤتمرIL Scavenging and Recovery Strategies to Improve the Performance and Reliability of HZO-Based FeFETs
المؤلفون: Kim, Bong Ho, Kim, Seong Kwang, Kuk, Song-hyeon, Suh, Yoon-Je, Jeong, Jaeyong, Kim, Joon Pyo, Geum, Dae-Myeong, Kim, Sanghyeon
المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Relation: 2023 International Electron Devices Meeting (IEDM)
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3مؤتمر
المؤلفون: Kim, Ho-Seung, Song, Hyeon-Su, Jung, Jiho, Lee, Bang-Wook
المصدر: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2023 IEEE Conference on. :1-4 Oct, 2023
Relation: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
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4مؤتمر
المؤلفون: Kuk, Song-Hyeon, Han, Jae-Hoon, Kim, Bong Ho, Kim, Junpyo, Kim, Sang-Hyeon
المصدر: 2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023
Relation: 2023 IEEE International Memory Workshop (IMW)
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5مؤتمر
المؤلفون: Kim, Ho-Seung, Song, Hyeon-Su, Lee, Bang-Wook
المصدر: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD) Condition Monitoring and Diagnosis (CMD), 2022 9th International Conference on. :695-698 Nov, 2022
Relation: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD)
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6مؤتمر
المؤلفون: Song, Hyeon-Su, Kim, Ho-Seung, Lee, Bang-Wook
المصدر: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD) Condition Monitoring and Diagnosis (CMD), 2022 9th International Conference on. :529-532 Nov, 2022
Relation: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD)
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7دورية أكاديمية
المؤلفون: Song, Hyeon-Su, Kim, Ho-Seung, Jung, Ji-Ho, Lee, Bang-WookAff1, IDs42835024019237_cor4
المصدر: Journal of Electrical Engineering & Technology. :1-11
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8دورية أكاديمية
المؤلفون: Kim, Dong ChanAff1, Aff2, Aff3, Seung, HyojinAff1, Aff2, Yoo, Jisu, Kim, JunheeAff1, Aff2, Song, Hyeon Hwa, Kim, Ji SuAff1, Aff2, Kim, Yunho, Lee, Kyunghoon, Choi, Changsoon, Jung, DongjunAff1, Aff2, Park, ChansulAff1, Aff2, Heo, HyeonjunAff1, Aff2, Yang, JiwoongAff5, IDs4192802401152w_cor13, Hyeon, TaeghwanAff1, Aff2, IDs4192802401152w_cor14, Choi, Moon KeeAff1, Aff4, Aff6, IDs4192802401152w_cor15, Kim, Dae-HyeongAff1, Aff2, Aff8, IDs4192802401152w_cor16
المصدر: Nature Electronics. 7(5):365-374
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9مؤتمر
المؤلفون: Kuk, Song-Hyeon, Han, Jae-Hoon, Kim, Bong Ho, Kim, Joon Pyo, Kim, Sang-Hyeon
المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
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10دورية أكاديمية
المؤلفون: Kim, Gun-Dong, Shin, Dong-Uk, Song, Hyeon-Ji, Lim, Kyung Min, Eom, Ji-Eun, Lim, Eun Yeong, Kim, Young In, Song, Ju Hye, Kim, Ha-Jung, Lee, So-Young, Shin, Hee Soon
المصدر: In Ecotoxicology and Environmental Safety August 2024 281