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1دورية أكاديمية
المؤلفون: Kawaguchi, KengoAff1, Aff2, Kohashi, KenichiAff1, Aff3, Iwasaki, Takeshi, Mori, Taro, Furukawa, HiroshiAff1, Aff2, Sato, Chiaki, Sonoda, HirokiAff1, Aff2, Shiraishi, SakuraAff1, Aff2, Endo, Makoto, Nakashima, Yasuharu, Oda, YoshinaoAff1, IDs00428024037967_cor11
المصدر: Virchows Archiv: European Journal of Pathology. :1-8
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2مؤتمر
المؤلفون: Miki, Takuji, Nagata, Makoto, Sonoda, Hiroki, Miura, Noriyuki, Okidono, Takaaki, Araga, Yuuki, Watanabe, Naoya, Shimamoto, Haruo, Kikuchi, Katsuya
المصدر: 2019 IEEE Asian Solid-State Circuits Conference (A-SSCC) Asian Solid-State Circuits Conference (A-SSCC), 2019 IEEE. :25-28 Nov, 2019
Relation: 2019 IEEE Asian Solid-State Circuits Conference (A-SSCC)
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3مؤتمر
المؤلفون: Sonoda, Hiroki, Nagata, Makoto, Tanaka, Daisuke, Murakami, Yoshihide, Mihara, Kyoshi, Makida, Kazuo, Kikuchi, Katsuya
المصدر: 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2019 12th International Workshop on the. :216-218 Oct, 2019
Relation: 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
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4دورية أكاديمية
المؤلفون: Mori, Taro, Iwasaki, Takeshi, Sonoda, Hiroki, Kawaguchi, Kengo, Tomonaga, Takumi, Furukawa, Hiroshi, Sato, Chiaki, Shiraishi, Sakura, Taguchi, Kenichi, Tamiya, Sadafumi, Yoneda, Reiko, Oshiro, Yumi, Matsunobu, Tomoya, Abe, Chie, Kuboyama, Yusuke, Ueki, Nozomi, Kohashi, Kenichi, Yamamoto, Hidetaka, Nakashima, Yasuharu, Oda, Yoshinao
المصدر: In Human Pathology March 2024 145:56-62
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5مؤتمر
المؤلفون: Sonoda, Hiroki, Monta, Kazuki, Okidono, Takaaki, Araga, Yuuki, Watanabe, Naoya, Shimamoto, Haruo, Kikuchi, Katsuya, Miura, Noriyuki, Miki, Takuji, Nagata, Makoto
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :31.5.1-31.5.4 Dec, 2020
Relation: 2020 IEEE International Electron Devices Meeting (IEDM)
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6مؤتمر
المؤلفون: Miki, Takuji, Miura, Noriyuki, Sonoda, Hiroki, Mizuta, Kento, Nagata, Makoto
المصدر: 2020 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2020 IEEE International Symposium on. :1-1 Oct, 2020
Relation: 2020 IEEE International Symposium on Circuits and Systems (ISCAS)
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7دورية أكاديمية
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8مؤتمر
المؤلفون: Higuchi, Shoma, Sonoda, Hiroki, Ito, Yu, Katakura, Kenta, Tomori, Hikari, Kanda, Akinobu
المصدر: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016. :1-1 Jun, 2016
Relation: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)]
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9مؤتمر
المؤلفون: Hiraide, Rineka, Sonoda, Hiroki, Higuchi, Shoma, Tomori, Hikari, Kanda, Akinobu
المصدر: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016. :1-1 Jun, 2016
Relation: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)]
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10
المؤلفون: Ishizu, Tomoko, Sonoda, Hiroki, Fujita, Satoshi
المصدر: Journal of Nuclear Engineering
Volume 4
Issue 1
Pages: 154-164مصطلحات موضوعية: model validation, core disruptive accident, melt freezing, THEFIS test, fast reactor, ULOF, penetration length
وصف الملف: application/pdf