المؤلفون: In-Hwan Ji, Young-Hwan Choi, Soo-Seong Kim, Kwang-Hoon Oh, Min-Koo Han

المصدر: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on. :1-4 2006

Relation: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (ISPSD)

المؤلفون: In-Hwan Ji, Byung-Chul Jeon, Young-Hwan Choi, Soo-Seong Kim, Min-Koo Han, Yearn-Ik Choi

المصدر: Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. Power semiconductor devices & ICs Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on. :87-90 2005

Relation: Proceedings of the 17th International Symposium on Power Semiconductor Devices & ICs

المؤلفون: Seung-Chul Lee, Min-Woo Ha, Jin-Cherl Her, Soo-Seong Kim, Ji-Yong Lim, Kwang-Seok Seo, Min-Koo Han

المصدر: Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. Power semiconductor devices & ICs Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on. :247-250 2005

Relation: Proceedings of the 17th International Symposium on Power Semiconductor Devices & ICs

المؤلفون: Byung-Chul Jeon, In-Hwan Ji, Soo-Seong Kim, Seung-Chul Lee, Yearn-Ik Choi, Min-Koo Han

المصدر: 2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on. :277-280 2004

Relation: Proceedings of the 16th International Symposium on Power Semiconductor Devices & IC's

المؤلفون: Seung-Chul Lee, Jin-Cherl Her, Soo-Seong Kim, Min-Woo Ha, Kwang-Seok Seo, Yearn-Ik Choi, Min-Koo Han

المصدر: 2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on. :319-322 2004

Relation: Proceedings of the 16th International Symposium on Power Semiconductor Devices & IC's

المؤلفون: Soo-Seong Kim, Chong-Man Yun, Yearn-Ik Choi, Min-Koo Han

المصدر: ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings. Power semiconductor devices and IC's Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on. :71-74 2003

Relation: IEEE International Symposium on Power Semiconductor Devices and Integrated Circuits

المؤلفون: Tae Hoon Kim, Chong Man Yun, Soo Seong Kim, Hyung Woo Jang

المصدر: 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on. :185-188 1999

Relation: 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD '99

المؤلفون: Byung-Chul Jeon, In-Hwan Ji, Young-Hwan Choi, Soo-Seong Kim, Yearn-Ik Choi, Min-Koo Han

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(3):191-193 Mar, 2005

المؤلفون: You-Sang Lee, Soo-Seong Kim, Jae-Keun Oh, Yearn-Ik Choi, Min-Koo Han

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 23(7):413-415 Jul, 2002

المؤلفون: You-Cheol Jang, Min-Woo Ha, Soo-Seong Kim, Yong-Sang Kim

المصدر: IEEE Transactions on Device and Materials Reliability. 20:731-736

مصطلحات موضوعية: 010302 applied physics, Materials science, Passivation, business.industry, Insulated-gate bipolar transistor, 01 natural sciences, Temperature measurement, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), Reliability (semiconductor), Gate oxide, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bec6d11777da72abdecc1e330f7e721c
https://doi.org/10.1109/tdmr.2020.3025895