المؤلفون: Wan-Don Kim, Jae-Hyun Joo, Yong-Kuk Jeong, Seok-Jun Won, Soon-Yeon Park, Sung-Choon Lee, Cha-Young Yoo, Sung-Tae Kim, Joo-Tae Moon

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :12.1.1-12.1.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Won-Sok Lee, Duhyun Lee, Sang Ho Jeon, Son Juho, D. Minn, Dae-Woong Kang, Sung-Gi Yang, Y. Aoki, J. Jang, Ki-chul Kim, Hyun-Chul Park, Jung-hyeon Kim, Soon-yeon Park, S. Kim, J. H. Lee, J.M. Park, B.S. Suh, M. Kim, Chung-woo Kim, Jung-Hyoung Lee, Kyung-Hoon Min, A.-S. Ryu, Young-Wug Kim, S.Y. Lee

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Physics, business.industry, Phased array, 020208 electrical & electronic engineering, 020206 networking & telecommunications, 02 engineering and technology, Integrated circuit, Radio spectrum, law.invention, CMOS, law, Extremely high frequency, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Radio frequency, Transceiver, business, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d86ad2928f3bbabca4604eaa3f43d36b
https://doi.org/10.1109/iedm13553.2020.9371948

المؤلفون: D. K. Sohn, Y.K. Bae, Y.D. Lim, Yohan Kim, J.G. Hong, C. Ryou, Soon-yeon Park, C.G. Koh, Jae Gon Lee, Jung-Chak Ahn, S. Hyun, Byung-chan Lee, Sangjoo Lee, Yang-Soo Son, D.H. Cha, C.L. Cheng, Sung-dae Suk, S.W. Nam, H.-J. Cho, J.S. Yoon, Won-Jun Jang, M. Sadaaki, Ming Li, S.H. Hong, Wouns Yang, Sang-pil Sim, Dong-Won Kim, S. Choi, Jung-In Hong, Won-Cheol Jeong, B. U. Yoon, Hwa-Sung Rhee, Min-Sang Kim, Chilhee Chung, Daphnee Hui Lin Lee, Sang-Bom Kang, Kang-ill Seo, Hee-Soo Kang

المصدر: 2011 International Electron Devices Meeting.

مصطلحات موضوعية: Planar, Materials science, Strain engineering, CMOS, business.industry, Low-power electronics, Electrical engineering, Optoelectronics, Short-channel effect, Static random-access memory, business, High-κ dielectric, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54cdf33871f7ca3ae9bad66959de4b4c
https://doi.org/10.1109/iedm.2011.6131556

المؤلفون: Soonchun Chung, Soon-yeon Park, S.-K. Shin, Kyung-Min Kang, Chang-Sub Lee, Hak-Ju Lee

المصدر: The Journal of bone and joint surgery. British volume. 93(10)

مصطلحات موضوعية: Male, medicine.medical_specialty, Visual analogue scale, Sitting, Disability Evaluation, Patient satisfaction, Lumbar, Activities of Daily Living, Medicine, Humans, Orthopedics and Sports Medicine, Post operative, Aged, Retrospective Studies, Aged, 80 and over, Lumbar Vertebrae, business.industry, Retrospective cohort study, Recovery of Function, Middle Aged, Oswestry Disability Index, Surgery, Spinal Fusion, Treatment Outcome, Functional disability, Patient Satisfaction, Female, Spinal Diseases, business, Follow-Up Studies

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::516457ae8b6e74b3480b7bd77768efc4
https://pubmed.ncbi.nlm.nih.gov/21969442

المؤلفون: A.T. Kim, Hong-jae Shin, M.Y. Kim, H. K. Kang, S.W. Nam, Y.J. Moon, Suk-Joo Lee, Tae-Kyung Kim, S.M. Choi, Young-Jin Wee, I.R. Kim, J.W. Hwang, B.S. Suh, J.E. Ku, Jae-Duk Lee, Won Ho Choi, G.P. Suh, K. W. Lee, Jung-hyeon Kim, Hyeon-deok Lee, I.H. Oh, A.M. Lee, Nae-In Lee, K.-K. Park, Soon-yeon Park, J.Y. Maeng

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

مصطلحات موضوعية: Interconnection, Compressive strength, Materials science, chemistry, Residual stress, Mechanical strength, chemistry.chemical_element, Dielectric, Composite material, Layer (electronics), Copper, Electromigration

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::17e857fa1202c6ab089b66acb91a486b
https://doi.org/10.1109/iedm.2004.1419343

المؤلفون: Yong-kuk Jeong, Soon-yeon Park, Jae-Hyun Joo, Sung-Choon Lee, Seok-jun Won, Joo-Tae Moon, Cha-young Yoo, Sung-tae Kim, Wan-Don Kim

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

مصطلحات موضوعية: Capacitor, Fabrication, Materials science, law, business.industry, Electrode, Dram capacitor, Optoelectronics, Nanotechnology, business, Deposition (law), Dram, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d0c9ec13a1a8e08a16ab85f4871e96c
https://doi.org/10.1109/iedm.2001.979480

المؤلفون: Kye Won Lee, Ilsub Chung, Taewan Kim, Soon-yeon Park, Ho Chan Ham

المصدر: Japanese Journal of Applied Physics. 43:2235

مصطلحات موضوعية: Materials science, business.industry, General Engineering, Oxide, Analytical chemistry, General Physics and Astronomy, Equivalent oxide thickness, chemistry.chemical_compound, Scanning probe microscopy, chemistry, Current conduction, Optoelectronics, Thin film, Current (fluid), business, Aluminum oxide, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f169e2525210de264eed5e69e3293396
https://doi.org/10.1143/jjap.43.2235