المؤلفون: Hoeju Chung, Youngchan Jang, Youngdon Choi, Park, Hwanwook, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Park, Moonsook, Hyungwsuk Kim, Sang-Yun Kim, Hyun-Kyung Kim, Su-Jin Chung, Eun-Mi Lee, Youngju Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Changhyun Kim

المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :29-32 Nov, 2008

Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Jei-Hwan Yoo, Woo-Seop Kim, Kim Sang-Yun, Hyung-seuk Kim, Jae-Kwan Kim, Soouk Lim, Hoe-ju Chung, Jung-Bae Lee, Moon-Sook Park, Yun-Sang Lee, Jung Sunwoo, Young-don Choi, Hwan-Wook Park, Young-Chan Jang, Chang-Hyun Kim

المصدر: IEEE Journal of Solid-State Circuits. 44:2987-2998

مصطلحات موضوعية: Input/output, Random access memory, Dynamic random-access memory, Hardware_MEMORYSTRUCTURES, Computer science, DIMM, CAS latency, law.invention, Non-volatile memory, Memory module, law, Electronic engineering, Bit error rate, Memory rank, Electrical and Electronic Engineering, Dram

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ffa8cfcae6804fc1cf089a3ded51feb2
https://doi.org/10.1109/jssc.2009.2028948

المؤلفون: Jung-Bae Lee, Sang-Yun Kim, Jung Sunwoo, Eun-Mi Lee, Young-Chan Jang, Woo-Seop Kim, Hwan-Wook Park, Hyun-Kyung Kim, Hoe-ju Chung, Young-Ju Kim, Su-Jin Chung, Chang-Hyun Kim, Soouk Lim, Yun-Sang Lee, Young-don Choi, Moon-Sook Park, Jae-Kwan Kim, Hyungwsuk Kim

المصدر: 2008 IEEE Asian Solid-State Circuits Conference.

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, business.industry, Computer science, Computation, Memory module, Test board, Gigabit, Bit error rate, Electronic engineering, business, Computer hardware, Dram, Coding (social sciences), Jitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::017af6aeeeb40aef38e73941d251a388
https://doi.org/10.1109/asscc.2008.4708721

المؤلفون: Young-Chan Jang, Hoeju Chung, Youngdon Choi, Hwanwook Park, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Moon-Sook Park, Hyung-Seuk Kim, Sang-Yun Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Jeihwan Yoo, Changhyun Kim

المصدر: IEEE Journal of Solid-State Circuits; Nov2009, Vol. 44 Issue 11, p2987-2998, 12p, 12 Black and White Photographs, 5 Diagrams, 5 Graphs

مصطلحات موضوعية: DYNAMIC random access memory, PERSONAL computers, PRINTED circuits, BIT rate, INTEGRATED circuits, ERROR rates