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1مؤتمر
المؤلفون: Sourty, E., Stanley, J., Freitag, B.
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :479-484 Jul, 2009
Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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2دورية أكاديمية
المؤلفون: Sourty, E., Sullivan, J.L., De Jong, L.A.M.
المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 39(3):1859-1861 May, 2003
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3مؤتمر
المؤلفون: Sourty, E., Sullivan, J.L., de Jong, L.A.M.
المصدر: IEEE International Digest of Technical Papers on Magnetics Conference International magnetic conference Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International. :AP15 2002
Relation: Intermag Europe 2002 Digest of Technical Papers. 2002 IEEE International Magnetics Conference
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4كتاب إلكتروني
المؤلفون: Kalio, AAff3, Richard, OAff3, Sourty, EAff4, Bender, HAff3
المساهمون: Cullis, A. G., editorAff1, Midgley, P. A., editorAff2
المصدر: Microscopy of Semiconducting Materials 2007. 120:387-390
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5كتاب إلكتروني
المؤلفون: Richard, OAff3, Kalio, AAff3, Bender, HAff3, Sourty, EAff3, Aff4
المساهمون: Cullis, A. G., editorAff1, Midgley, P. A., editorAff2
المصدر: Microscopy of Semiconducting Materials 2007. 120:375-378
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6دورية أكاديمية
المؤلفون: Gomez-Villalba, L.S., Sourty, E., Freitag, B., Milosevic, O., Rabanal, M.E.
المصدر: In Advanced Powder Technology September 2013 24(5):864-870
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7كتاب إلكتروني
المؤلفون: Verheijen, M. A.Aff2, Algra, R.Aff3, Borgström, M. T.Aff2, Immink, G.Aff2, Sourty, E.Aff5, Feiner, L. F.Aff2, van Enckevort, W. J. P.Aff4, Vlieg, E.Aff4, Bakkers, E. P. A. M.Aff3
المساهمون: Richter, Silvia, editorAff1, Schwedt, Alexander, editorAff1
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 2: Materials Science. :159-160
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8كتاب إلكتروني
المؤلفون: Sourty, E.Aff3, Aff4, Freitag, B.Aff3, Wall, D.Aff3, Tang, D.Aff3, Lu, K.Aff4, Aff6, Loos, J.Aff4, Aff5, Aff6
المساهمون: Luysberg, Martina, editorAff1, Tillmann, Karsten, editorAff1, Weirich, Thomas, editorAff2
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :335-336
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9دورية أكاديمية
المؤلفون: Bender, H., Richard, O., Kalio, A., Sourty, E.
المصدر: In Microelectronic Engineering 2007 84(11):2707-2713
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10دورية أكاديمية
المؤلفون: SOURTY, E., RYAN, D. H., MARCHESSAULT, R. H.
المصدر: Cellulose. March 1998 5(1):5-17