المؤلفون: Sourty, E., Stanley, J., Freitag, B.

المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :479-484 Jul, 2009

Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Sourty, E., Sullivan, J.L., De Jong, L.A.M.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 39(3):1859-1861 May, 2003

المؤلفون: Sourty, E., Sullivan, J.L., de Jong, L.A.M.

المصدر: IEEE International Digest of Technical Papers on Magnetics Conference International magnetic conference Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International. :AP15 2002

Relation: Intermag Europe 2002 Digest of Technical Papers. 2002 IEEE International Magnetics Conference

المؤلفون: Kalio, A^Aff3, Richard, O^Aff3, Sourty, E^Aff4, Bender, H^Aff3

المساهمون: Cullis, A. G., editor^Aff1, Midgley, P. A., editor^Aff2

المصدر: Microscopy of Semiconducting Materials 2007. 120:387-390

المؤلفون: Richard, O^Aff3, Kalio, A^Aff3, Bender, H^Aff3, Sourty, E^{Aff3, Aff4}

المساهمون: Cullis, A. G., editor^Aff1, Midgley, P. A., editor^Aff2

المصدر: Microscopy of Semiconducting Materials 2007. 120:375-378

المؤلفون: Gomez-Villalba, L.S., Sourty, E., Freitag, B., Milosevic, O., Rabanal, M.E.

المصدر: In Advanced Powder Technology September 2013 24(5):864-870

المؤلفون: Verheijen, M. A.^Aff2, Algra, R.^Aff3, Borgström, M. T.^Aff2, Immink, G.^Aff2, Sourty, E.^Aff5, Feiner, L. F.^Aff2, van Enckevort, W. J. P.^Aff4, Vlieg, E.^Aff4, Bakkers, E. P. A. M.^Aff3

المساهمون: Richter, Silvia, editor^Aff1, Schwedt, Alexander, editor^Aff1

المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 2: Materials Science. :159-160

المؤلفون: Sourty, E.^{Aff3, Aff4}, Freitag, B.^Aff3, Wall, D.^Aff3, Tang, D.^Aff3, Lu, K.^{Aff4, Aff6}, Loos, J.^{Aff4, Aff5, Aff6}

المساهمون: Luysberg, Martina, editor^Aff1, Tillmann, Karsten, editor^Aff1, Weirich, Thomas, editor^Aff2

المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :335-336

المؤلفون: Bender, H., Richard, O., Kalio, A., Sourty, E.

المصدر: In Microelectronic Engineering 2007 84(11):2707-2713

المؤلفون: SOURTY, E., RYAN, D. H., MARCHESSAULT, R. H.

المصدر: Cellulose. March 1998 5(1):5-17