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1دورية أكاديمية
المؤلفون: Russo-Spena, T., Tregua, M., Amitrano, C.C., Bifulco, F.
المصدر: IEEE Transactions on Engineering Management IEEE Trans. Eng. Manage. Engineering Management, IEEE Transactions on. 71:12138-12150 2024
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2مؤتمر
المصدر: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :1150-1155 Oct, 2023
Relation: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
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3مؤتمر
المؤلفون: Galasso, Bernardino, Ameduri, Salvatore, Concilio, Antonio, Totaro, Giovanni, Spena, Paola, Giusto, Giovangiuseppe
المصدر: 2023 14th International Conference on Mechanical and Aerospace Engineering (ICMAE) Mechanical and Aerospace Engineering (ICMAE), 2023 14th International Conference on. :513-517 Jul, 2023
Relation: 2023 14th International Conference on Mechanical and Aerospace Engineering (ICMAE)
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4دورية أكاديمية
المؤلفون: Mirandola, Pietro, Novel, David, Perini, Matteo, Benedetti, Matteo, Lombardi, Franco, Lunetto, VincenzoAff4, IDs00170024142379_cor6, Spena, Pasquale Russo
المصدر: The International Journal of Advanced Manufacturing Technology. :1-16
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5مؤتمر
المؤلفون: Di Bernardo, Irene, Marzullo, Marialuisa, Mele, Cristina, Spena, Tiziana Russo, Russo, Stefano Paolo
المصدر: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2022 IEEE International Conference on. :517-521 Oct, 2022
Relation: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
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6مؤتمر
المؤلفون: Cavacece, Ylenia, Ebraico, Sara, Spena, Tiziana Russo, Mele, Cristina, Leone, Daniele, Schiavone, Francesco, Bastone, Anna
المصدر: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2022 IEEE International Conference on. :522-527 Oct, 2022
Relation: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
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7مؤتمر
المؤلفون: Berrilli, Francesco, Bifaretti, Stefano, Bonaiuto, Vincenzo, Consolini, Giuseppe, Del Moro, Dario, Orru, Luca, Santo, Luca, Silletti, Francesco, Spena, Angelo, Terlizzi, Cristina
المصدر: 2022 AEIT International Annual Conference (AEIT) AEIT International Annual Conference (AEIT), 2022. :1-6 Oct, 2022
Relation: 2022 AEIT International Annual Conference (AEIT)
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8رسالة جامعية
المؤلفون: Russo Spena, Raffaella
المساهمون: University/Department: Universitat Politècnica de Catalunya. Departament de Composició Arquitectònica
مرشدي الرسالة: Rovira, Josep M. (Josep Maria Rovira Gimeno)
المصدر: TDX (Tesis Doctorals en Xarxa)
وصف الملف: application/pdf
URL الوصول: http://hdl.handle.net/10803/320180
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9دورية أكاديمية
المؤلفون: Panza, LuigiAff1, IDs12008023017337_cor1, Bruno, Giulia, Antal, Gabriel, De Maddis, Manuela, Russo Spena, Pasquale
المصدر: International Journal on Interactive Design and Manufacturing (IJIDeM). :1-18
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10دورية أكاديمية
المؤلفون: Pellegrini, MarcoAff1, Aff2, Aff3, Yu, Angeli ChristyAff1, Aff2, Aff3, Spena, RossellaAff1, Aff2, Aff3, Bovone, CristinaAff1, Aff2, Aff3, Zauli, Giorgio, Busin, MassimoAff1, Aff2, Aff3, IDs41433023027440_cor6
المصدر: Eye: The Scientific Journal of The Royal College of Ophthalmologists. 38(3):614-619