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1
المؤلفون: Jonathan Fales, Binod Kumar G. Nair, Jeffrey E. Nelson, Frank E. Gennari, Philippe Hurat, Jac Condella, Akif Sultan, Aaron Sinnott, Xiaoyuan Qi, Sriram Madhavan, Uwe Paul Schroeder, Rwik Sengupta, Ya-Chieh Lai
المصدر: IEEE Transactions on Semiconductor Manufacturing. 34:372-378
مصطلحات موضوعية: Computer science, Process (engineering), Yield (finance), Semiconductor device modeling, Critical area, Integrated circuit, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Reliability engineering, law.invention, law, Range (statistics), Electrical and Electronic Engineering, Failure mode and effects analysis, Scaling
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2
المؤلفون: Lynn T. N. Wang, Uwe Paul Schroeder, Punitha Selvam, Fadi Salameh Batarseh, Pouya Rezaeifakhr, Ariel de Jesus Reyes Ruiz, Teodora Nicolae, Ivan Tanev, Sriram Madhavan
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0294b0817b7f623bad62e21463b51049
https://doi.org/10.1117/12.2614460 -
3
المؤلفون: Parnashri Wankhede, Devansh Singh, Manish Kumar Sahu, Aruna Veluru, Monisa Ramesh Babu, Chenlong Miao, Shenghua Song, Shobhit Malik, Sriram Madhavan
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fc7fcc03896adebf99f30711acf38bfb
https://doi.org/10.1117/12.2614185 -
4
المؤلفون: Suraag S. Tellakula, Uwe Paul Schroeder, Janam Bakshi, Punitha Selvam, Pouya Rezaeifakhr, Sriram Madhavan
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::03781103a9108b123ccf1e2d6ffa9f09
https://doi.org/10.1117/12.2613828 -
5
المؤلفون: Shenghua Song, Eric Chiu, Panneerselvam Venkatachalam, CT Lim, Chenlong Miao, Sriram Madhavan, William Wilkinson, Haizhou Yin, Shobhit Malik, Monisa Ramesh Babu, Peter Lin, Michael Wojtowecz, Deborah Ryan
المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Design rule checking, Computer science, business.industry, Semiconductor device fabrication, Integrated circuit, Design for manufacturability, law.invention, Reliability engineering, Workflow, Product lifecycle, Analytics, law, Node (circuits), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f451d018163ccbc244df6bb8763d8207
https://doi.org/10.1109/asmc51741.2021.9435661 -
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المؤلفون: Piyush Pathak, Uwe Paul Schroeder, Fadi Batarseh, Philippe Hurat, Jeffrey E. Nelson, Sriram Madhavan, Ya-Chieh Lai
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Similarity (network science), Computer science, Metric (mathematics), Pattern matching, Semi-supervised learning, Approximate string matching, Physical design, Cluster analysis, Algorithm, Ranking (information retrieval)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40d43d18d5b04c9fb948289250bf8f06
https://doi.org/10.1117/12.2586112 -
7
المؤلفون: Rais Huda, Zhao Chuan Lee, Sriram Madhavan, Michael Simcoe, Uwe Paul Schroeder, Vikas Mehrotra, Lynn T.-N. Wang, Mckay Thomas G
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Analogue electronics, Computer science, Parasitic element, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Schematic, Topology (electrical circuits), Hardware_PERFORMANCEANDRELIABILITY, Routing (electronic design automation), Network topology, Capacitance, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1c94d00d01d3ce407d3ceaba4c9dfc59
https://doi.org/10.1117/12.2583839 -
8
المؤلفون: Zhao Chuan Lee, Uwe Paul Schroeder, Michael Simcoe, Janam Bakshi, Vikas Mehrotra, Gail Katzman, Rais Huda, Lynn T.-N. Wang, Ahmed Abdulghany, Sriram Madhavan
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Constraint (information theory), Analogue electronics, Circuit performance, business.industry, Computer science, Hardware_INTEGRATEDCIRCUITS, Hardware_PERFORMANCEANDRELIABILITY, Pattern matching, business, Group identification, Computer hardware, Design for manufacturability, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e6929f63144d465e5975002f4ffc75c5
https://doi.org/10.1117/12.2551945 -
9
المؤلفون: Joo Hyun Park, Deborah Ryan, Haizhou Yin, Pouya Rezaeifakhr, Shobhit Malik, Eric Chiu, Panneerselvam Venkatachalam, Kiruthika Murali, Praneetha Poluju, Shenghua Song, Sriram Madhavan, Monisa Ramesh Babu, Qian Xie
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Computer science, business.industry, Big data, computer.software_genre, Field (computer science), Outlier, Data analysis, Feature (machine learning), Anomaly detection, Data mining, Layer (object-oriented design), Cluster analysis, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::79f9de1e6db1263bdcc99d042c7302e5
https://doi.org/10.1117/12.2551939 -
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المؤلفون: Michael Simcoe, Uwe Paul Schroeder, Sriram Madhavan, Gail Katzman, Rais Huda, Blackwell Don Raymond, Yongfu Li, Lynn T.-N. Wang, Ahmed Abdulghany, Thomas Hermann, Mckay Thomas G, Janam Bakshi, Zhao Chuan Lee, Vikas Mehrotra
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIII.
مصطلحات موضوعية: Matching (statistics), Computer science, Design flow, Extremely high frequency, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Radio frequency, Pattern matching, Inductor, Planarity testing, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::014484dc2a7baeb39cff5c40a7915223
https://doi.org/10.1117/12.2514769