المؤلفون: Daniol, Mateusz, Boehler, Lukas, Keller, Anton, Sroka, Ryszard

المصدر: 2018 IEEE International Conference on Imaging Systems and Techniques (IST) Imaging Systems and Techniques (IST), 2018 IEEE International Conference on. :1-5 Oct, 2018

Relation: 2018 IEEE International Conference on Imaging Systems and Techniques (IST)

المؤلفون: Bohler, Lukas, Daniol, Mateusz, Keller, Anton, Sroka, Ryszard

المصدر: 2018 IEEE International Conference on Imaging Systems and Techniques (IST) Imaging Systems and Techniques (IST), 2018 IEEE International Conference on. :1-5 Oct, 2018

Relation: 2018 IEEE International Conference on Imaging Systems and Techniques (IST)

المؤلفون: Marszalek, Zbigniew, Sroka, Ryszard, Zeglen, Tadeusz

المصدر: 2017 22nd International Conference on Methods and Models in Automation and Robotics (MMAR) Methods and Models in Automation and Robotics (MMAR), 2017 22nd International Conference on. :889-893 Aug, 2017

Relation: 2017 22nd International Conference on Methods and Models in Automation and Robotics (MMAR)

المؤلفون: Marszalek, Zbigniew, Sroka, Ryszard

المصدر: 2016 21st International Conference on Methods and Models in Automation and Robotics (MMAR) Methods and Models in Automation and Robotics (MMAR), 2016 21st International Conference on. :25-29 Aug, 2016

Relation: 2016 21st International Conference on Methods and Models in Automation and Robotics (MMAR)

المؤلفون: Marszalek, Zbigniew, Sroka, Ryszard, Zeglen, Tadeusz

المصدر: 2015 20th International Conference on Methods and Models in Automation and Robotics (MMAR) Methods and Models in Automation and Robotics (MMAR), 2015 20th International Conference on. :765-769 Aug, 2015

Relation: 2015 20th International Conference on Methods and Models in Automation and Robotics (MMAR )

المؤلفون: Gajda, Janusz, Sroka, Ryszard, Stencel, Marek, Zeglen, Tadeusz, Piwowar, Piotr, Burnos, Piotr, Marszalek, Zbigniew

المصدر: 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International. :1036-1041 May, 2015

Relation: 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Sroka, Ryszard, Gajda, Janusz, Burnos, Piotr, Piwowar, Piotr

المصدر: 2015 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2015 IEEE. :1-6 Apr, 2015

Relation: 2015 IEEE Sensors Applications Symposium (SAS)

المؤلفون: Gajda, Janusz, Sroka, Ryszard, Stencel, Marek, Zeglen, Tadeusz, Piwowar, Piotr, Burnos, Piotr

المصدر: 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International. :772-775 May, 2012

Relation: 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Daniol, Mateusz^{Aff35, Aff36}, Böhler, Lukas^{Aff35, Aff36}, Keller, Anton^Aff35, Sroka, Ryszard^Aff36

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Ruediger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Liang, Qilian, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Möller, Sebastian, Series Editor^Aff22, Mukhopadhyay, Subhas, Series Editor^Aff23, Ning, Cun-Zheng, Series Editor^Aff24, Nishida, Toyoaki, Series Editor^Aff25, Pascucci, Federica, Series Editor^Aff26, Qin, Yong, Series Editor^Aff27, Seng, Gan Woon, Series Editor^Aff28, Veiga, Germano, Series Editor^Aff29, Wu, Haitao, Series Editor^Aff30, Zhang, Junjie James, Series Editor^Aff31, Hanus, Robert, editor^Aff32, Mazur, Damian, editor^Aff33, Kreischer, Christian, editor^Aff34

المصدر: Methods and Techniques of Signal Processing in Physical Measurements. 548:31-43

المؤلفون: Böhler, Lukas^{Aff35, Aff36}, Daniol, Mateusz^{Aff35, Aff36}, Keller, Anton^Aff35, Sroka, Ryszard^Aff36

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Ruediger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Liang, Qilian, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Möller, Sebastian, Series Editor^Aff22, Mukhopadhyay, Subhas, Series Editor^Aff23, Ning, Cun-Zheng, Series Editor^Aff24, Nishida, Toyoaki, Series Editor^Aff25, Pascucci, Federica, Series Editor^Aff26, Qin, Yong, Series Editor^Aff27, Seng, Gan Woon, Series Editor^Aff28, Veiga, Germano, Series Editor^Aff29, Wu, Haitao, Series Editor^Aff30, Zhang, Junjie James, Series Editor^Aff31, Hanus, Robert, editor^Aff32, Mazur, Damian, editor^Aff33, Kreischer, Christian, editor^Aff34

المصدر: Methods and Techniques of Signal Processing in Physical Measurements. 548:13-30