المؤلفون: Zenari, M., Buffolo, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Kumari, S., Stassren, A., Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Journal of Quantum Electronics IEEE J. Quantum Electron. Quantum Electronics, IEEE Journal of. 59(4):1-10 Aug, 2023

المؤلفون: Zenari, M., Buffolo, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, Alexander, 1993, Gustavsson, Johan, 1974, Kumari, Sulakshna, Stassren, A., Baets, Roel G., Larsson, Anders, 1957, Roelkens, Gunther, Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: Vertical-Cavity Surface-Emitting Lasers XXVII 2023, San Francisco, USA Proceedings of SPIE - The International Society for Optical Engineering. 12439

مصطلحات موضوعية: VCSIL, Degradation, Diffusion, PICs

وصف الملف: electronic

URL الوصول: https://research.chalmers.se/publication/535978
https://research.chalmers.se/publication/535978/file/535978_Fulltext.pdf