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1مؤتمر
المؤلفون: Steinmann, Philipp, Lichtenwalner, Daniel J., Stein, Shane, Park, Jae-Hyung, Das, Suman, Ryu, Sei-Hyung
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P58.SiC-1-P58.SiC-4 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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2مؤتمر
المؤلفون: Sobreviela-Falces, Guillermo, Pandit, Milind, Young, Douglas, Pili, Callisto, Mcintosh, James, Abbott, Julian, Brook, Guy, Reed, Matthew, Steinmann, Philipp, MacCarthy, Niall, Baker, Colin, Seshia, Ashwin A.
المصدر: 2022 IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS) Micro Electro Mechanical Systems Conference (MEMS), 2022 IEEE 35th International Conference on. :782-785 Jan, 2022
Relation: 2022 IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS)
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3مؤتمر
المؤلفون: Pandit, Milind, Sobreviela, Guillermo, Pili, Callisto, Steinmann, Philipp, Young, Douglas, Zhao, Chun, Baker, Colin, Seshia, Ashwin
المصدر: 2021 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL) Inertial Sensors and Systems (INERTIAL), 2021 IEEE International Symposium on. :1-4 Mar, 2021
Relation: 2021 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)
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4مؤتمر
المؤلفون: Lichtenwalner, Daniel J., Sabri, Shadi, Brunt, Edward van, Hull, Brett, Ryu, Sei-Hyung, Steinmann, Philipp, Romero, Amy, Ganguly, Satyaki, Gajewski, Donald A., Allen, Scott, Palmour, John W.
المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-6 Oct, 2020
Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)
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5مؤتمر
المؤلفون: Pandit, Milind, Mustafazade, Arif, Zhao, Chun, Sobreviela, Guillermo, Zou, Xudong, Steinmann, Philipp, Seshia, Ashwin
المصدر: 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2019 IEEE 32nd International Conference on. :664-667 Jan, 2019
Relation: 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS)
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6مؤتمر
المؤلفون: Ganguly, Satyaki, Lichtenwalner, Daniel J., Isaacson, Caleb, Gajewski, Donald A., Steinmann, Philipp, Foarde, Ryan, Hull, Brett, Ryu, Sei-Hyung, Allen, Scott, Palmour, John W.
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :8B.1-1-8B.1-6 Mar, 2022
Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)
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7دورية أكاديمية
المصدر: Journal of Applied Physics; 6/21/2023, Vol. 133 Issue 23, p1-9, 9p
مصطلحات موضوعية: IMPACT ionization, SCHOTTKY barrier diodes, TEMPERATURE, BREAKDOWN voltage
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8مؤتمر
المؤلفون: Wang, Yiwei, Chae, Seung-Hyun, Dunne, Rajiv, Takahashi, Yoshimi, Mawatari, Kazuaki, Steinmann, Philipp, Bonifield, Tom, Jiang, Tengfei, Im, Jay, Ho, Paul S.
المصدر: 2012 IEEE 62nd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd. :319-325 May, 2012
Relation: 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC)
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9مؤتمر
المؤلفون: Dunne, Rajiv, Takahashi, Yoshimi, Mawatari, Kazuaki, Matsuura, Masamitsu, Bonifield, Tom, Steinmann, Philipp, Stepniak, Dave
المصدر: 2012 IEEE 62nd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd. :1062-1067 May, 2012
Relation: 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC)
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10دورية أكاديمية
المؤلفون: Affolter, Stéphane, Steinmann, Philipp, Aemisegger, Franziska, Purtschert, Roland, Leuenberger, Markus
المصدر: In Journal of Environmental Radioactivity October 2020 222