المؤلفون: Nack, Felipe, Stemmer, Marcelo Ricardo, Stivanello, Mauricio Edgar

المصدر: IEEE Latin America Transactions IEEE Latin Am. Trans. Latin America Transactions, IEEE (Revista IEEE America Latina). 22(4):286-293 Apr, 2024

المؤلفون: França, José Alexandre de, França, Maria Bernadete de M., Stemmer, Marcelo Ricardo, Palácios, Rodrigo Henrique C.

المصدر: Sba: Controle & Automação Sociedade Brasileira de Automatica. June 2011 22(3)

مصطلحات موضوعية: Calibração de câmeras, Gabarito de calibração, Objeto 1D, Calibração binocular

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-17592011000300002

المؤلفون: da Silva, Thayse Christine, Stemmer, Marcelo Ricardo

المصدر: 2019 Tenth International Conference on Intelligent Control and Information Processing (ICICIP) Intelligent Control and Information Processing (ICICIP), 2019 Tenth International Conference on. :198-205 Dec, 2019

Relation: 2019 Tenth International Conference on Intelligent Control and Information Processing (ICICIP)

المؤلفون: Ramos, Ubiratan, Stivanello, Mauricio Edgar, Stemmer, Marcelo Ricardo

المصدر: IEEE Latin America Transactions IEEE Latin Am. Trans. Latin America Transactions, IEEE (Revista IEEE America Latina). 18(12):2104-2111 Dec, 2020

المؤلفون: Matias, André Victória, Amorim, João Gustavo Atkinson, Macarini, Luiz Antonio Buschetto, Cerentini, Allan, Onofre, Alexandre Sherlley Casimiro, Onofre, Fabiana Botelho de Miranda, Daltoé, Felipe Perozzo, Stemmer, Marcelo Ricardo, von Wangenheim, Aldo

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition, Electrical Engineering and Systems Science - Image and Video Processing

URL الوصول: http://arxiv.org/abs/2105.11277

المؤلفون: Macarini, Luiz Antonio Buschetto, von Wangenheim, Aldo, Daltoé, Felipe Perozzo, Onofre, Alexandre Sherlley Casimiro, Onofre, Fabiana Botelho de Miranda, Stemmer, Marcelo Ricardo

مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2002.08331

المؤلفون: Roloff, Mario Lucio, Amaral, Cleber Jorge, Stivanello, Mauricio Edgar, Stemmer, Marcelo Ricardo

المصدر: 2016 12th IEEE International Conference on Industry Applications (INDUSCON) Industry Applications (INDUSCON), 2016 12th IEEE International Conference on. :1-7 Nov, 2016

Relation: 2016 12th IEEE International Conference on Industry Applications (INDUSCON)

المؤلفون: de Mello, Alexandre Reeberg, Stemmer, Marcelo Ricardo, Koerich, Alessandro Lameiras

المصدر: Information Sciences, 2020

مصطلحات موضوعية: Computer Science - Machine Learning, Statistics - Machine Learning

URL الوصول: http://arxiv.org/abs/1907.09613

المؤلفون: Szymanski, Charbel, Stemmer, Marcelo Ricardo

المصدر: 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2015 IEEE 24th International Symposium on. :594-599 Jun, 2015

Relation: 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)

المؤلفون: Stivanello, Mauricio Edgar, Vargas, Saulo, Roloff, Mario Lucio, Stemmer, Marcelo Ricardo

المصدر: IEEE Latin America Transactions IEEE Latin Am. Trans. Latin America Transactions, IEEE (Revista IEEE America Latina). 14(7):3065-3073 Jul, 2016