-
1
المؤلفون: Samantha T. Jaszewski, Philip Ryan, Michael David Henry, Jon F. Ihlefeld, Alejandro Salanova, Paul Davids, Ian A. Brummel, Giovanni Esteves, Sean W. Smith, Steve Wolfley, Shelby S. Fields
المصدر: ACS Applied Materials & Interfaces. 12:26577-26585
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Ferroelectricity, Hafnium, Tetragonal crystal system, chemistry.chemical_compound, chemistry, Tantalum nitride, Phase (matter), 0103 physical sciences, General Materials Science, Orthorhombic crystal system, 0210 nano-technology, Polarization (electrochemistry), Monoclinic crystal system
-
2
المؤلفون: Jonatan A. Sierra Suarez, Lyle Brunke, Steve Wolfley, Nancy A. Missert, Matthaeus A. Wolak, Michael David Henry, Rupert Lewis
المصدر: IEEE Transactions on Applied Superconductivity. 29:1-4
مصطلحات موضوعية: Josephson effect, Fabrication, Materials science, Chemical substance, business.industry, Sputter deposition, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Volumetric flow rate, 0103 physical sciences, Optoelectronics, Wafer, Electrical and Electronic Engineering, 010306 general physics, business, Science, technology and society, Deposition (law)
-
3
المؤلفون: Ting S. Luk, Alec McKay, Darwin K. Serkland, Ben Jasperson, Theodore J. Morin, Loren Gastian, Michael G. Wood, Harley T. Johnson, John Mudrick, Steve Wolfley
المصدر: Conference on Lasers and Electro-Optics.
مصطلحات موضوعية: Range (particle radiation), Materials science, Infrared, business.industry, Vanadium, chemistry.chemical_element, Limiting, Wavelength, Vanadium dioxide, Mode-locking, chemistry, Limiter, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ba0ae3f9eba4a43ecdd71309e9304754
https://doi.org/10.1364/cleo_si.2021.sth1e.3 -
4
المؤلفون: Lyle Brunke, Nancy A. Missert, Steve Wolfley, Rupert Lewis, John Mudrick, Michael David Henry, Steve Howell
المصدر: IEEE Transactions on Applied Superconductivity. 27:1-4
مصطلحات موضوعية: 010302 applied physics, Josephson effect, Materials science, Analytical chemistry, Nanotechnology, Partial pressure, Condensed Matter Physics, 01 natural sciences, Temperature measurement, Electronic, Optical and Magnetic Materials, Root mean square, Sputtering, 0103 physical sciences, Surface roughness, Electrical and Electronic Engineering, Thin film, 010306 general physics, Deposition (law)
-
5
المؤلفون: Shelby S. Fields, Jon F. Ihlefeld, Paul Davids, Michael David Henry, Chris M. Fancher, Stephen McDonnell, Samantha T. Jaszewski, Mark A. Rodriguez, Steve Wolfley, Maria Gabriela Sales, Sean W. Smith, Giovanni Esteves
المصدر: Advanced Materials Interfaces. 8:2100018
مصطلحات موضوعية: Materials science, business.industry, Mechanical Engineering, Nitride, Ferroelectricity, Stress (mechanics), Metal, Mechanics of Materials, Phase (matter), visual_art, Electrode, visual_art.visual_art_medium, Optoelectronics, Thin film, business, Polarization (electrochemistry)
-
6
المؤلفون: Christopher D. Nordquist, Christopher T. Rodenbeck, Joyce O. Custer, Tyler S. Jordan, Darin Leonhardt, Steve Wolfley, Sean Scott
المصدر: IEEE Transactions on Electron Devices. 61:813-819
مصطلحات موضوعية: Materials science, business.industry, Thermal resistance, Analytical chemistry, Biasing, Atmospheric temperature range, Optical switch, Temperature measurement, Electronic, Optical and Magnetic Materials, Characterization (materials science), Optoelectronics, Electrical and Electronic Engineering, Current (fluid), Thin film, business
-
7
المؤلفون: Steve Wolfley, Todd C. Monson, Rupert Lewis, M. David Henry
المصدر: Applied Physics Letters. 105:072601
مصطلحات موضوعية: Plasma etching, Fabrication, Physics and Astronomy (miscellaneous), business.industry, Niobium, Nanowire, chemistry.chemical_element, Nanotechnology, Focused ion beam, Nanolithography, chemistry, Optoelectronics, business, Tin, Lithography
-
8
المؤلفون: Blythe Clark, Todd C. Monson, Eric A. Shaner, Robert L. Jarecki, M. David Henry, Steve Wolfley
المصدر: Journal of Applied Physics. 115:083903
مصطلحات موضوعية: Secondary ion mass spectrometry, Materials science, chemistry, Sputtering, Electrical resistivity and conductivity, Transition temperature, Analytical chemistry, Niobium, General Physics and Astronomy, chemistry.chemical_element, Sputter deposition, Thin film, Sheet resistance