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1مؤتمر
المؤلفون: Smith, S., Brockie, N. L., Murray, J., Wilson, C. J., Horsfall, A. B., Terry, J. G., Stevenson, J. T. M., Mount, A. R., Walton, A. J.
المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :80-85 Mar, 2010
Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)
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2مؤتمر
المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A. C., Stevenson, J. T. M., Walton, A. J.
المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :24-29 Mar, 2010
Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)
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3مؤتمر
المؤلفون: Li, Y., Fu, Y. Q., Flynn, B. W., Parkes, W., Liu, Y., Brodie, S., Terry, J. G., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S., Walton, A. J.
المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :52-57 Mar, 2010
Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)
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4مؤتمر
المؤلفون: Smith, S., Brockie, N. L., Murray, J., Wilson, C. J., Horsfall, A. B., Terry, J. G., Stevenson, J. T. M., Mount, A. R., Walton, A. J.
المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :8-13 Mar, 2010
Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)
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5دورية أكاديمية
المؤلفون: Li, Y., Fu, R. Y., Winters, D., Flynn, B. W., Parkes, B., Brodie, D. S., Liu, Y., Terry, J., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S., Mackay, C. L., Langridge-Smith, P. R. R., Stokes, A. A., Walton, A. J.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 25(3):323-330 Aug, 2012
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6دورية أكاديمية
المؤلفون: Smith, S., Brockie, N. L., Murray, J., Schiavone, G., Wilson, C. J., Horsfall, A. B., Terry, J. G., Stevenson, J. T. M., Mount, A. R., Walton, A. J.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 25(3):346-354 Aug, 2012
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7دورية أكاديمية
المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A. C., Stevenson, J. T. M., Walton, A. J., Dixson, R. G., Allen, R. A., Potzick, J. E., Cresswell, M. W., Orji, N. G.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 22(1):72-79 Feb, 2009
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8دورية أكاديمية
المؤلفون: Li, Y., Parkes, W., Haworth, L. I., Ross, A. W. S., Stevenson, J. T. M., Walton, A. J.
المصدر: Journal of Microelectromechanical Systems J. Microelectromech. Syst. Microelectromechanical Systems, Journal of. 17(6):1481-1488 Dec, 2008
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9دورية أكاديمية
المؤلفون: Shulver, B. J. R., Bunting, A. S., Gundlach, A. M., Haworth, L. I., Ross, A. W. S., Smith, S., Snell, A. J., Stevenson, J. T. M., Walton, A. J., Allen, R. A., Cresswell, M. W.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(4):495-503 Nov, 2008
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10دورية أكاديمية
المؤلفون: Curtis, J. C., Baldwin, K., Dworak, B. J., Stevenson, J. T. M., Delivopoulos, E., MacLeod, N. K., Murray, A. F.
المصدر: Journal of Microelectromechanical Systems J. Microelectromech. Syst. Microelectromechanical Systems, Journal of. 17(4):974-983 Aug, 2008
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