المؤلفون: Zhang, Binjie, Hou, Shuai, Zhan, Yunpeng, Yin, Yi, Wang, Yalin

المصدر: 2024 IEEE 5th International Conference on Dielectrics (ICD) Dielectrics (ICD), 2024 IEEE 5th International Conference on. :1-4 Jun, 2024

Relation: 2024 IEEE 5th International Conference on Dielectrics (ICD)

المؤلفون: Abbas, Ahmad, Le Royer, Cyrille, Lavieville, Romain, Gningue, Saliou, Chouk, Rihab, Biscarrat, Jerome, Bano, Edwige, Godignon, Philippe

المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :176-179 Jun, 2024

Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Schwachhofer, Denis, Angione, Francesco, Becker, Steffen, Wagner, Stefan, Sauer, Matthias, Bernardi, Paolo, Polian, Ilia

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-4 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Lim, M.J.Z., Loh, H.G., Goroll, M., Chen, Z., Tan, C.S.

المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 14(5):945-950 May, 2024

المؤلفون: Prisco, Giuseppe, Komici, Klara, Mercaldo, Francesco, Donisi, Leandro, Cesarelli, Mario, Guerra, Germano, Santone, Antonella

المصدر: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :646-651 Oct, 2023

Relation: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

المؤلفون: Tsai, Chen-Lin, Huang, Shi-Yu

المصدر: 2023 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2023 IEEE International. :1-6 Sep, 2023

Relation: 2023 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Deligiannis, N.I., Faller, T., Cantoro, R., Paxian, T., Becker, B., Reorda, M.S.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(11):4270-4281 Nov, 2023

المؤلفون: Otto-Meyer, Sebastian^{Aff1, IDs00246024036235_cor1}, Wang, Alan P., Griffith, Garett J., Gambetta, Katheryn, Ward, Kendra

المصدر: Pediatric Cardiology. :1-8

المؤلفون: Fischer, Andreas^{Aff1, IDs00402024054771_cor1}, Rüdiger, H. A., Hersche, O., Leunig, M., Stephan, A., Aepli, M.

المصدر: Archives of Orthopaedic and Trauma Surgery: Including Arthroscopy and Sports Medicine. :1-5

المؤلفون: Hanika, Moritz^{Aff1, IDs13385023003713_cor1}

المصدر: European Actuarial Journal. 14(2):525-550