المؤلفون: Perera, A.H., Smith, B., Cave, N., Sureddin, M., Chheda, S., Islam, R., Chang, J., Song, S.-C., Sultan, A., Crown, S., Kolagunta, V., Shah, S., Celik, M., Wu, D., Yu, K.C., Fox, R., Park, S., Simpson, C., Eades, D., Gonzales, S., Thomas, C., Sturtevant, J., Bonser, D., Benavides, N., Thompson, M., Sheth, V., Fretwell, J., Kim, S., Ramani, N., Green, K., Moosa, M., Besser, P., Solomentsev, Y., Denning, D., Friedemann, M., Baker, B., Chowdhury, R., Ufmani, S., Strozewski, K., Carter, R., Reiss, J., Olivares, M., Ho, B., Lii, T., Sparks, T., Stephens, T., Schaller, M., Goldberg, C., Junker, K., Wristers, D., Alvis, J., Melnick, B., Venkatesan, S.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :571-574 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Lucas, K., Yuan, C.-M., Boone, R., Wimmer, K., Strozewski, K., Toublan, O.

المصدر: IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 23(1):30-37 Jan, 2006

المؤلفون: Yu, K.C., Werking, J., Prindle, C., Kiene, M., Ng, M.-F., Wilson, B., Singhal, A., Stephens, T., Huang, F., Sparks, T., Aminpur, M., Linville, J., Denning, D., Brennan, B., Shahvandi, I., Wang, C., Flake, J., Chowdhury, R., Svedberg, L., Solomentsev, Y., Kim, S., Cooper, K., Usmani, S., Smith, D., Olivares, M., Carter, R., Eggenstein, B., Strozewski, K., Junker, K., Goldberg, C., Filipiak, S., Martin, J., Grove, N., Ramani, N., Ryan, T., Mueller, J., Guvenilir, A., Zhang, D., Ventzek, P., Wang, V., Lii, T., King, C., Crabtree, P., Farkas, J., Iacoponi, J., Pellerin, J., Melnick, B., Woo, M., Weitzman, E.

المصدر: Proceedings of the IEEE 2002 International Interconnect Technology Conference (Cat. No.02EX519) Interconnect technology conference Interconnect Technology Conference, 2002. Proceedings of the IEEE 2002 International. :9-11 2002

Relation: Proceedings of the IEEE 2002 International Interconnect Technology Conference

المؤلفون: Conley, W., Nelson-Thomas, C., Brankner, K., Wei Wu, Strozewski, K., Thompson, M., Lucas, K., Garza, C., Chi-Min Yuan, Carter, R., Montgomery, P., Socha, R., Yu, L., van den Broke, D., Wampler, K., Schaefer, E., Cassel, S., Kuijten, J.-P., Verhappen, A., Pijnenburg, W., Maltabes, J.G., Dieu, L., Fanucchi, E.L., Hughes, G., Mellenthin, D., Kasprowicz, B., Progler, C.

المصدر: 2002 International Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and nanotechnology Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International. :294 2002

Relation: Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International Microprocesses and Nanotechnology Conference

المؤلفون: Parihar, S., Angyal, M., Boeck, B., Reber, D., Singhal, A., Van Gompel, T., Li, R., Wilson, B., Wright, M., Chen, J., Grudowski, P., Jeon, Y., Qi, W., Bai, X., Parker, L., Strozewski, K., Smith, D., Roling, S., Sparks, T., Stephens, T., Huang, F., Mora, R., Aminpur, M., Hellig, K., Vishnubhotla, L., Solomentsev, Y., Arunachalam, V., Phillips, A., Junker, K., Filipiak, S., Ramani, N., Turner, M., Rendon, M., Molloy, J., McGuffin, K., Michel, A., Pena, R., Rose, D., Schmidt, J., Smith, M., Wilson, M., Terpolilli, L., Le, P., Sun, J., Ross, R., Yu, K., Hall, M., Ingersoll, P., Woo, M., Yeap, G., Lage, C.

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :11.4.1-11.4.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: McBride, S.E., Wetsel, G.C., Strozewski, K.

المصدر: LEOS '90. Conference Proceedings IEEE Lasers and Electro-Optics Society 1990 Annual Meeting Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE. :219-220 1990

Relation: LEOS '90 - Conference Proceedings IEEE Lasers and Electro-Optics Society 1990 Annual Meeting

المؤلفون: Strozewski, K. J., McBride, S. E., Wetsel, G. C.

المصدر: Journal of Applied Physics; 6/1/1996, Vol. 79 Issue 11, p8638, 5p, 1 Diagram, 4 Graphs

مصطلحات موضوعية: PHOTON emission, SCANNING tunneling microscopy

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المؤلفون: Nebbia, G., Hagel, K., Fabris, D., Majka, Z., Natowitz, J. B., Schmitt, R. P., Sterling, B., Mouchaty, G., Berkowitz, G., Strozewski, K., Viesti, Giuseppe, Gonthier, P. L., Wilkins, B., Namboodiri, M. N., Ho, H.

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http://hdl.handle.net/11577/2500275

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