المؤلفون: Lin, M.H., Lin, Y.L., Yang, G.S., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :177-180 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Wang, C.S., Chen, M.J., Chang, W.C., Ke, W.S., Lee, C.F., Su, K.C., Chou, E.N.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :169-172 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Wang, C.S., Chang, W.C., Ke, W.S., Lee, C.F., Su, K.C., Chang, Y.J., Chou, E.N., Chen, M.J.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :315-318 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Tsai, C.C., Yeh, M.-S., Liu, C.C., Hsu, S., Wang, C.H., Sheng, Y.C., Chang, K.P., Su, K.C., Chang, Y.J., Tahui Wang

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :229-233 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(12):2602-2608 Dec, 2005

المؤلفون: Pai, S.Y., Lee, J.K. Jerry, Ng, Kenny, Hsiao, Reality, Su, K.C., Chou, E.N.

المصدر: 2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :229-235 Apr, 2009

Relation: 2009 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Chou, A., Chang, K.-J., Mathews, R., Wong, K., Wang, T., Wei, Y.-H., Su, K.C., Hsue, P.

المصدر: ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) Microelectronic test structures Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on. :189-191 1998

Relation: ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures

المؤلفون: Yang, J.Y.C., Cheng-Li Lin, Chan-Yuan Hu, Ju-Ping Chen, Chia-Jen Kao, Su, K.C.

المصدر: 2006 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2006 IEEE International. :179-181 Oct, 2006

Relation: 2006 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: Cheng-Li Lin, Kao, T., Ju-Ping Chen, Yang, J.Y.C., Su, K.C.

المصدر: 2006 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2006 IEEE International. :186-189 Oct, 2006

Relation: 2006 IEEE International Integrated Reliability Workshop Final Report