المؤلفون: Yu-Ping Chien, Stanislav Mráz, Clio Azina, Szilárd Kolozsvári, Peter Polcik, Jochen M. Schneider

المصدر: Open Ceramics, Vol 17, Iss , Pp 100538- (2024)

مصطلحات موضوعية: Magnetron sputtering, Substrate rotation, HIPIMS, Cr2AlC MAX phase, Thin films, Clay industries. Ceramics. Glass, TP785-869

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2666539524000026; https://doaj.org/toc/2666-5395

URL الوصول: https://doaj.org/article/71eedb62a7e4477ab27057fac21ca33e

المؤلفون: Hsu, Tun-Wei, 1991, Greczynski, Grzegorz, 1973, Christensen, Bjarke Holl, Almtoft, Klaus Pagh, Boyd, Robert, 1972, Kolozsvári, Szilárd, Polcik, Peter, Bolz, Stephan, Kölker, Werner, Schiffers, Christoph, Mesic, Biljana, Odén, Magnus, 1965

المصدر: Surface & Coatings Technology. 453

مصطلحات موضوعية: Thin films, TiAlSiN, Magnetron sputtering, HiPIMS, Al+ and Si+ irradiation, Substrate rotation

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-191778
https://doi.org/10.1016/j.surfcoat.2022.128986
https://liu.diva-portal.org/smash/get/diva2:1736680/FULLTEXT01.pdf

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المؤلفون: Stevens, Margaret A., Grossklaus, Kevin A., McElearney, John H., Vandervelde, Thomas E.^Aff1

المصدر: Journal of Electronic Materials. 48(5):3376-3382

المؤلفون: Shirvan, Kamel Milani, Ellahi, Rahmat^Aff2, Sheikholeslami, Tahereh Fanaie, Behzadmehr, Amin

المصدر: Neural Computing and Applications. 30(12):3721-3731

المؤلفون: Chen, Chen^{Aff1, Aff2}, Li, Yun-Ju^Aff2, Zhang, Hao, Li, Zhi-Hong^{Aff2, Aff3}

المصدر: Nuclear Science and Techniques. 31(9)

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المؤلفون: Tun-Wei Hsu, Grzegorz Greczynski, Bjarke Holl Christensen, Klaus Pagh Almtoft, Robert Boyd, Szilárd Kolozsvári, Peter Polcik, Stephan Bolz, Werner Kölker, Christoph Schiffers, Biljana Mesic, Magnus Odén

مصطلحات موضوعية: Nanoteknik, Thin films, HiPIMS, Surfaces and Interfaces, General Chemistry, Materials Engineering, Al+ and Si+ irradiation, Condensed Matter Physics, Surfaces, Coatings and Films, Materialteknik, Materials Chemistry, Nano Technology, Substrate rotation, Den kondenserade materiens fysik, Magnetron sputtering, TiAlSiN

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a69e8a9213aad2e09249627fcd9e0f1d
http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-191778

المؤلفون: Schubert, Mathias^Aff1

المساهمون: Höhler, Gerhard, editor, Kühn, Johann H., editor, Müller, Thomas, editor, Trümper, Joachim, editor, Ruckenstein, Andrei, editor, Wölfle, Peter, editor, Steiner, Frank, editor, Schubert, Mathias

المصدر: Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons. 209:173-179

المؤلفون: Schöner, A.^Aff4

المساهمون: Choyke, W. J., editor^Aff1, Matsunami, H., editor^Aff2, Pensl, G., editor^Aff3

المصدر: Silicon Carbide : Recent Major Advances. :229-250