يعرض 1 - 10 نتائج من 617 نتيجة بحث عن '"Sugahara, Satoshi"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر
    Basic Characteristics of Thin-Film Single-Layer Coreless Micro-Transformers for Digital Isolators

    المؤلفون: Inohara, Motochika, Sugahara, Satoshi

    المصدر: 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia) Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia), 2022 International. :2567-2572 May, 2022

    Relation: 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)

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  2. 2
    دورية أكاديمية
    Spin Injection Behavior of CoFe/MgO/Si Tunnel Contacts: Effects of Radical Oxygen Annealing

    المؤلفون: Akushichi, TaijuAff1, Aff2, IDs11664023106064_cor1, Takamura, Yota, Shiotsu, Yusaku, Yamamoto, Shuu’ichirou, Sugahara, Satoshi

    المصدر: Journal of Electronic Materials. 52(10):6902-6910

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  3. 3
    مؤتمر
    Design and Performance of Virtually Nonvolatile Retention Flip-Flop Using Dual-Mode Inverters

    المؤلفون: Kitagata, Daiki, Yamamoto, Shuu'ichirou, Sugahara, Satoshi

    المصدر: 2018 New Generation of CAS (NGCAS) CAS (NGCAS), 2018 New Generation of. :186-189 Nov, 2018

    Relation: 2018 New Generation of CAS (NGCAS)

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  4. 4
    مؤتمر
    Simulation Analysis of Optimum Gate Driving Conditions of IGBTs

    المؤلفون: Sugahara, Satoshi, Kawakami, Masaki, Kamakura, Kousuke

    المصدر: 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) Power Electronics Conference (IPEC-Niigata 2018 –ECCE Asia), 2018 International. :2756-2763 May, 2018

    Relation: 2018 International Power Electronics Conference (IPEC-Niigata 2018 –ECCE Asia)

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  5. 5
    مؤتمر
    Design and Performance of π-Type Thin-Film Nano/Micro-TEG Using Vacuum/SiO2-Hybrid Insulation Module Structure

    المؤلفون: Seino, Toshimasa, Chiwaki, Nana, Yamashita, Suzune, Sugahara, Satoshi

    المصدر: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :292-294 Mar, 2018

    Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)

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  6. 6
    مؤتمر
    Energy performance of nonvolatile power-gating SRAM using SOTB technology

    المؤلفون: Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi

    المصدر: ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference European Solid-State Circuits Conference, ESSCIRC Conference 2016: 42nd. :95-98 Sep, 2016

    Relation: ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference

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  7. 7
    مؤتمر
    New power-gating architectures using nonvolatile retention: Comparative study of nonvolatile power-gating (NVPG) and normally-off architectures for SRAM

    المؤلفون: Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi

    المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :136-141 Mar, 2016

    Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)

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  8. 8
    مؤتمر
    Analysis of break-even time for nonvolatile SRAM with SOTB technology

    المؤلفون: Kitagata, Daiki, Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi

    المصدر: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :72-74 Feb, 2017

    Relation: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)

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  9. 9
    مؤتمر
    Design and performance of thin-film μTEG modules for wearable device applications

    المؤلفون: Kondo, Tsuyoshi, Chiwaki, Nana, Sugahara, Satoshi

    المصدر: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :201-203 Feb, 2017

    Relation: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)

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  10. 10
    مؤتمر
    Comparative study of power-gating architectures for nonvolatile FinFET-SRAM using spintronics-based retention technology

    المؤلفون: Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi

    المصدر: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015. :866-871 Mar, 2015

    Relation: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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