-
1مؤتمر
المؤلفون: Inohara, Motochika, Sugahara, Satoshi
المصدر: 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia) Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia), 2022 International. :2567-2572 May, 2022
Relation: 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)
-
2دورية أكاديمية
المؤلفون: Akushichi, TaijuAff1, Aff2, IDs11664023106064_cor1, Takamura, Yota, Shiotsu, Yusaku, Yamamoto, Shuu’ichirou, Sugahara, Satoshi
المصدر: Journal of Electronic Materials. 52(10):6902-6910
-
3مؤتمر
المؤلفون: Kitagata, Daiki, Yamamoto, Shuu'ichirou, Sugahara, Satoshi
المصدر: 2018 New Generation of CAS (NGCAS) CAS (NGCAS), 2018 New Generation of. :186-189 Nov, 2018
Relation: 2018 New Generation of CAS (NGCAS)
-
4مؤتمر
المؤلفون: Sugahara, Satoshi, Kawakami, Masaki, Kamakura, Kousuke
المصدر: 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) Power Electronics Conference (IPEC-Niigata 2018 –ECCE Asia), 2018 International. :2756-2763 May, 2018
Relation: 2018 International Power Electronics Conference (IPEC-Niigata 2018 –ECCE Asia)
-
5مؤتمر
المؤلفون: Seino, Toshimasa, Chiwaki, Nana, Yamashita, Suzune, Sugahara, Satoshi
المصدر: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :292-294 Mar, 2018
Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
-
6مؤتمر
المؤلفون: Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi
المصدر: ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference European Solid-State Circuits Conference, ESSCIRC Conference 2016: 42nd. :95-98 Sep, 2016
Relation: ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference
-
7مؤتمر
المؤلفون: Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi
المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :136-141 Mar, 2016
Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)
-
8مؤتمر
المصدر: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :72-74 Feb, 2017
Relation: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
-
9مؤتمر
المؤلفون: Kondo, Tsuyoshi, Chiwaki, Nana, Sugahara, Satoshi
المصدر: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :201-203 Feb, 2017
Relation: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
-
10مؤتمر
المؤلفون: Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi
المصدر: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015. :866-871 Mar, 2015
Relation: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)